MODIFICATION
66 -- PURCHASE OF ION MILLING AND POLISHING SYSTEM
- Notice Date
- 5/21/2004
- Notice Type
- Modification
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition and Logistics Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 3571, Gaithersburg, MD, 20899-3571
- ZIP Code
- 20899-3571
- Solicitation Number
- SB1341-04-Q-0533
- Response Due
- 5/28/2004
- Archive Date
- 5/29/2004
- Point of Contact
- Joseph Widdup, Contract Specialist, Phone (301) 975-6324, Fax (301) 975-8884,
- E-Mail Address
-
joseph.widdup@nist.gov
- Small Business Set-Aside
- Total Small Business
- Description
- The purpose of this amendment is to post questions received regarding this RFQ and answers to those questions for potential offerors to consider in constructing their response to this RFQ. QUESTION 1: What are the applications? Is this exclusively for TEM or would other capabilities of Broad Beam Ion Milling be of interest? ANSWER TO QUESTION 1: TEM sample preparation is the main purpose. If another product meets or exceeds RFQ specifications and has additional capabilities (that don't detract from TEM sample preparation), then NIST will consider an offer for such a product. QUESTION 2: What materials are being milled? ANSWER TO QUESTION 2: NIST prepares a wide variety of materials for both plan-view and cross-section TEM: metals, ceramics, and semiconductors, bulk materials, thin films on substrates, electrically conductive (and non-conductive), etc. QUESTION 3: Are there any materials that cannot be handled by conventional ion milling systems? ANSWER TO QUESTION 3: Based on NIST's understanding of the question, we believe the answer is no to this question. QUESTION 4: What is the application for Chemical Etching (CAIBE)? Would other methods of achieving the same results be acceptable? ANSWER TO QUESTION 4: CAIBE is intended to remove surface damage that remains even after low voltage, low angle, and low beam current milling has been used to prepare a sample. NIST would consider an offer for other methods that will achieve the required results. The offerror shall clearly describe exactly how their offered product performs this function if such an alternative is offered. NOTE: THIS NOTICE WAS NOT POSTED TO WWW.FEDBIZOPPS.GOV ON THE DATE INDICATED IN THE NOTICE ITSELF (21-MAY-2004); HOWEVER, IT DID APPEAR IN THE FEDBIZOPPS FTP FEED ON THIS DATE. PLEASE CONTACT fbo.support@gsa.gov REGARDING THIS ISSUE.
- Web Link
-
Link to FedBizOpps document.
(http://www.eps.gov/spg/DOC/NIST/AcAsD/SB1341-04-Q-0533/listing.html)
- Record
- SN00590811-F 20040523/040521215110 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)
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