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FBO DAILY ISSUE OF JUNE 29, 2006 FBO #1676
SOLICITATION NOTICE

66 -- Scanning Probe Microscope (SPM)

Notice Date

6/27/2006
 

Notice Type

Solicitation Notice
 

NAICS

334516 — Analytical Laboratory Instrument Manufacturing
 

Contracting Office

Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, MD, 20899-1640
 

ZIP Code

20899-1640
 

Solicitation Number

SB1341-06-Q-0486
 

Response Due

7/12/2006
 

Archive Date

7/27/2006
 

Description

THIS IS A COMBINED SYNOPSIS/SOLICITATION FOR COMMERCIAL ITEMS PREPARED IN ACCORDANCE WITH THE FORMAT IN FAR SUBPART 12.6-STREAMLINED PROCEDURES FOR EVALUATION AND SOLICITATION FOR COMMERCIAL ITEMS-AS SUPPLEMENTED WITH ADDITIONAL INFORMATION INCLUDED IN THIS NOTICE. SIMPLIFIED ACQUISITION PROCEEDURES ARE UTILIZED IN THIS PROCUREMENT. THIS ANNOUNCEMENT CONSTITUTES THE ONLY SOLICITATION; QUOTATIONS ARE BEING REQUESTED, AND A WRITTEN SOLICITATION DOCUMENT WILL NOT BE ISSUED. This solicitation is a Request for Quotation (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular (FAC) 2005-09. *** The associated North American Industrial Classification System (NAICS) code for this procurement is 334516 with a small business size standard of 500 employees. This requirement is 100% set aside for small businesses. Only interested small businesses may submit a quote. ***The National Institute of Standards and Technology (NIST) has a requirement for a Scanning Probe Microscope (SPM) to be used in the Process Measurements Division at NIST, Gaithersburg, MD. *** BACKGROUND: The Process Sensing Group at NIST has a requirement for a scanning probe microscope system (SPM) also referred to as an Atomic Force Microscope (AFM). The SPM will be a shared user instrument, used by several projects within the PSG including chemical microsensors, nanomaterial sensors (gold nanoparticles, carbon nanotubes, and nanowires), and biological thin films of DNA and proteins. Successful analysis of these diverse materials requires a SPM instrument with high resolution, dynamic scan area, multiple imaging modes, the ability to analyze large samples, and compatibility with standard accessories for future expansion of experimental capabilities. Because metrology is of critical importance to the projects studied at NIST, it is required that the SPM system be equipped with independent x-y and z scanners, to eliminate cross talk and image bowing typical of stacked x-y-z piezoelectric tube scanners, and closed-loop hardware feedback to obtain exact and repeatable placement of tip to substrate. The Contractor shall provide a quote for the following line item: Line Item 0001: Scanning Probe Microscope (SPM) The required microscope shall meet or exceed the following specifications: 1) Computer controlled system including a PC computer and system controller electronics interface allowing for control of sample stage, tip placement, and computer control of instrument for acquisition of scanning images and stationary tip surface measurements. System control unit to computer communication interface to be USB based enabling future computer system upgrades by PSG. Future software upgrades shall be included in the purchase price. 2) The system shall include "offline" software for data analysis and processing that can be installed on computers supplied by PSG. The software will have the ability to export data (both force distance curves and images) in Image File (JPG, PNG, BMP) and Text File (TXT) formats. Future software upgrades shall be included. 3) The system shall include a motorized Z stage to move the sample in the z direction relative to the tip and an X-Y sample stage to move the sample in the x and y directions relative to the tip. 4) The system must accommodate a minimum sample size of 75mm x 25mm (X and Y) x 15 mm thick (Z). The PSG foresees larger future sample requirements up to 100mm x 100mm (X and Y) and 20mm thick (Z). 5) The system shall include an optical microscope with CCD Camera capable of 1 micron resolution and direct on-axis view of the SPM tip. 6) The system shall be capable of operating in contact, non-contact, lateral force, and phase imaging atomic force microscopy (AFM) modes as well as force vs. distance spectroscopy. 7) The system shall provide SPM image resolution up to 4096 x 4096 pixels (4096 data points along each of 4096 scan lines). 8) X-Y and Z Scanners: a) The system shall include a SPM Z-Scanner that operates independent of an included SPM X-Y Scanner, providing decoupled X-Y & Z scanning with less than 2 nm of out-of-plane X-Y motion for a 50 micron X-Y scan range. b) The system shall provide closed-loop hardware feedback scan position in X, Y, and Z axes. c) The X-Y scanner shall have a maximum scan range of at least 100 microns, and be capable of less than 0.2 nm resolution at a 100 micron X-Y scan range and less than 0.02 nm resolution at 10 micron X-Y scan range. d) The Z scanner shall have a maximum scan range of at least 10 microns, and be capable of less than 0.05 nm resolution at 10 micron scan range and less than 0.01 nm resolution at 2 micron scan range. 9) The system shall be able to image spatial variations in electrical conductivity over a sample surface, correlated with topography, with a sharpened conductive AFM tip. The system shall also be able to measure current (I) vs. voltage (V) behavior with bias loading between -10 V and + 10 V over a current range of 1 pA to 10 mA. The system shall include necessary accessories to enable electrical conductivity imaging of the surface including 5 contact AFM tips with conductive coating. 10) The system shall include a signal access unit for monitoring and driving all significant AC and DC signals used in the operation of the instrument for NIST modification of instrument operation. These signals shall include, but are not limited to: x, y and z piezoelectric voltages, x, y and z displacement voltages, tip and sample bias, cantilever deflection, amplitude and phase information from AC scan mode, plus user input and output signals. 11) The system shall include an assortment of contact and non-contact AFM probes including but not limited to: mounted contact AFM probes, mounted non-contact AFM probes, mounted conductive AFM probes, mounted sharpened contact AFM probes, and any standard necessary tools needed to mount probes or samples. 12) The vendor shall provide specifications for an optional acoustic enclosure to minimize external optical and acoustic noise. 13) A complete set of manuals shall be supplied with the instrument. 14) The contractor shall provide on-site installation and training for NIST staff members in system operation and routine maintenance. 15) The instrument shall be compatible with the following standard accessories /modes (not included in this order) for future expansion of experimental capabilities. a) Lithography: Provide an integrated lithography package to enable the nanoscale writing (speed: 0 ~ 2mm/s) of user defined patterns (point/grid pattern or pattern generation from an image (bitmap file). b) Manipulation: Provide precise control of probe to manipulate nanoscale objects. c) Magnetic Field Imaging: Provide ability to image the spatial variation of magnetic forces on a sample surface, correlated with topography, with a tip coated with a ferromagnetic thin film with at least 20 nm lateral resolution. d) Scanning Thermal Imaging: Provide ability to map the thermal properties (temperature variation and thermal conductivity variation) of a sample surface by using a resistive thermal nanoscale probe. Provide spatial resolution of at least 100 nm, and temperature resolution of 0.1 degree Celsius. ***Delivery shall be FOB DESTINATION and be delivered to NIST on or before September 31, 2006. The instrument shall be installed by the contractor as scheduled with PSG and functioning to specifications within two (2) weeks or less upon installation. ***The contractor shall pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for any loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery. The contractor shall deliver all line items to NIST, Building 301, Shipping and Receiving, Gaithersburg, MD 20899-0001. *** ****The Government will evaluate information based on the following evaluation criteria: 1) Technical Capability factor "Meeting or Exceeding the Requirement," 2) Past Performance, and 3) Price. Technical Capability and Past Performance, when combined, are equal to Price. ****Evaluation of Technical Capability shall be based on the information provided in the quotation. Quotations shall include the make and model of the products, manufacturer sales literature or other product literature, which CLEARLY DOCUMENTS that the offered product(s) meet or exceed the specifications stated above. ****Past Performance will be evaluated to determine the overall quality of the product and service, provided by the Contractor. Evaluation of Past Performance shall be based on the references provided IAW FAR 52.212-1(b)(10) and/ or information provided by NIST or its? affiliates. Quoters shall provide a list of at least THREE (3) REFERENCES to whom the same or similar products have been sold. The list of references shall include, at a minimum: The name of the reference contact person and the company or organization; the telephone number of the reference contact person; the contract or grant number; the amount of the contract and the address and the telephone number of the Contracting Officer if applicable; and the date of delivery or the date services were completed. ***The following provisions and clauses apply to this acquisition: Provisions: 52.212-1, Instructions to Offerors-Commercial Items; and 52.212-3 Offeror Representations and Certifications-Commercial Items. ***Offerors shall complete annual representations and certifications on-line at http://orca.bpn.gov in accordance with FAR 52.212-3 Offerors Representations and Certifications- Commercial Items. If paragraph (j) of the provision is applicable, a written submission is required. *** ***The following clauses apply to this acquisition: 52.204-7 Central Contractor Registration; 52.212-4 Contract Terms and Conditions?Commercial Items; 52.212-5 Contract Terms and Conditions Required to Implement Statutes or Executive Orders?Commercial Items including subparagraphs: (14) 52.222-3, Convict Labor; (15) 52.222-19, Child Labor-Cooperation with Authorities and Remedies; (16) 52.222-21, Prohibition of Segregated Facilities; (17) 52.222-26, Equal Opportunity; (18) 52.222-35, Equal Opportunity for Special Disabled Veterans, Veterans of the Vietnam Era, and Other Eligible Veterans; (19) 52.222-36, Affirmative Action for Workers with Disabilities; (20) 52.222-37, Employment Reports on Special Disabled Veterans, Veterans of the Vietnam Era, and Other Eligible Veterans; (24)(i) 52.225-3, Buy American Act-Free Trade Agreements- Israeli Trade Act; (26) 52.225-13, Restrictions on Certain Foreign Purchases; (31) 52.232-33, Payment by Electronic Funds Transfer-Central Contractor Registration. Department of Commerce Agency-Level Protest Procedures Level above the Contracting Officer is also incorporated. It can be downloaded at www.nist.gov/admin/od/contract/agency.htm. All clauses may be viewed at www.acqnet.gov. *** ***All vendors shall submit the following: 1) An original and one (1) copy of a quotation which addresses all Line Items; 2) Two (2) Originals of the Technical description and/or product literature; 3) Description of commercial warranty; and 4) One (1) copy of the most recent published price list. ***All quotes shall be received not later than 3:30 PM local time, on July 12, 2006 at the National Institute of Standards & Technology, Acquisition and Logistics Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 3571, Gaithersburg, MD 20899-3571, Attn: Jennifer Roderick. Because of heightened security, FED-EX, UPS, or similar delivery methods are the preferred method of delivery of quotes. If quotes are hand delivered, delivery shall be made on the actual due date through Gate A, and a 48 hour (excluding weekends and holidays) prior notice shall be made to the Contracts Office at 301-975-4959. NIST is not responsible for late delivery due to the added security measures. In addition, offerors/quoters who do not provide 24-hour notification in order to coordinate entrance to the NIST campus shall assume the risk of not being able to deliver offers/quotes on time. The Government is not responsible for the amount of time required to clear unannounced visitors, visitors without proper identification and without complete information that would allow delivery (i.e. point of contact, telephone POC, bldg., room number, etc.). If 24 hour notification was not provided, it is suggested your company representative or your courier service arrive at NIST at least 90 minutes prior to the closing time in order to process entry to the campus through the visitor center and complete delivery. Notice shall include the company name, name of the individual making the delivery, and the country of citizenship of the individual. For non-US citizens, the following additional information will be required: title, employer/sponsor, and address. Please ensure that the individual making the delivery brings photo identification, or they will be denied access to the facility. Faxed quotes will NOT be accepted. *** Numbered Notes 1. ***
 

Place of Performance

Address: 100 Bureau Drive, Shipping & Receiving, Building 301, Gaithersburg, Maryland

Zip Code: 20899-0001

Country: USA
 

Record

SN01078173-W 20060629/060627220353 (fbodaily.com)
 

Source

FedBizOpps Link to This Notice
(may not be valid after Archive Date)

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