SOLICITATION NOTICE
66 -- INDUCTIVELY COUPLED PLASMA SPECTROMETER
- Notice Date
- 8/21/2006
- Notice Type
- Solicitation Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- NASA/John F. Kennedy Space Center, Procurement, Kennedy Space Center, FL 32899
- ZIP Code
- 32899
- Solicitation Number
- NNK06166555Q
- Response Due
- 9/6/2006
- Archive Date
- 8/21/2007
- Small Business Set-Aside
- N/A
- Description
- NASA/KSC has a requirement for one (1) each Inductively Coupled Plasma Spectrometer as described below. This requirement also includes a Laser Ablation Sample System and instrumentation training. The final deliverables shall consist of the following: Fully operational Inductively Coupled Plasma Spectrometer with Laser Ablation System, On-site training and Operating Manuals. CLIN 01 ? INDUCTIVELY COUPLED PLASMA SPECTROMETER: A compact Radial/Axial ICP system is required for flexible, high speed analysis of major and minor elements in a variety of samples. The instrument and any accessories supplied should be computer controlled by a central-desktop PC with Windows 2000 or XP based software. Measurement techniques for qualitative and quantitative measurement of analyses should be included. I. Inductively Coupled Plasma Source 1. The plasma source shall consist of an integral, water cooled, all solid state, 27MHz RF generator and have an output power from 750 to 1600 watts, controllable in 25W increments. 2. The generator shall have a high coupling efficiency of >78% and be directly coupled with a swing frequency impedance control and power regulation to better than 0.1%. 3. Plasma ignition, operating power and shutdown shall be computer controlled to enable optimised parameters to be stored in an analytical method and recalled, providing the ability to automatically alter plasma parameters during a run. 4. Complete shielding of the ICP source from stray UV and RF emissions shall be provided. A viewing window with UV protection shall be included to enable the operator to view the plasma and sample cone in complete safety. 5. The system shall be fully compliant with the requirements of the EU Low Voltage Directive - 73/23/EEC and the EU EMC Directive - 89/336/EEC. 6. Safety interlocks throughout the system shall provide safe shut down of the generator without damage to the instrument in the event of power failure. In addition, all failure events must be recorded to an electronic error file and must include event description, time and date. II. Gas Control 1. Operation of the gas system shall be under full computer control with mass flow controllers on all three plasma gases. 2. An optional mass flow controller shall be available for the addition of supplementary gases to the plasma. The unit shall operate over the range 0-1 L/Min in steps of 0.01 L/Min. III. Sample Introduction System 1. The instrument will include a sample introduction area that has ease of access and maintenance and be close coupled to the peristaltic pump to minimize sample uptake delays. 2. A high efficiency cyclone spray chamber fitted with a high performance glass concentric nebulizer shall be provided for optimum stability and best detection limits with fast washout and minimum cross contamination. 3. A semi-demountable quartz ICP torch with a 1.5mm diameter separate injector shall be provided for maximum flexibility. The torch design shall include a quick release, pre-aligned mounting block which minimizes torch alignment when re-installing and doesn?t require tools for removal. The mount shall incorporate the plasma gas connections so that when the torch is inserted gases will be automatically connected. 4. The viewing height of the plasma must be adjustable under computer control to enable optimization whilst the plasma is lit, in complete safety to the operator. It shall be possible to store and recall optimized settings in an analytical method along with other instrument parameters. 5. It shall be possible to automatically optimize the RF power, coolant gas, auxiliary gas, nebuliser gas, pump speed and viewing height within a method. The method of optimization shall include maximum signal, maximum signal to background ratio and best detection limit for any element or group of elements. 6. Sample introduction shall be via an integral, close coupled and variable speed, peristaltic pump with a minimum of 12 rollers. The pump shall have a minimum of 4-channels to accommodate sample and drain and additional channels for addition of internal standards or other reagents. The pump speed shall be computer controlled to provide programmable sample flows both during and between sample measurements. Provision shall be included for the pump to be automatically switched into a standby mode upon instrument shutdown. 7. The instrument shall include a sensor on the drain from the spray chamber for monitoring the drain flow. In the event of leaks or interruption in the flow the instrument shall be safely shutdown to prevent possible damage from acidic samples or risk of fire with organic solvents. 8. Optional sample introduction kits shall be available for the analysis of high solids, hydrofluoric acid, organic solvents, and volatile organic solvents. IV. Plasma Viewing 1. The plasma shall be viewed axially with a modified torch extended to screen off atmospheric gases. Auxiliary optics shall be available to provide a radial plasma view. 2. The instrument shall have the possibility to automatically switch between axial and radial view during an analysis. Available viewing modes shall include all axial, all radial, automatic view and element selection. V. Optical System 1. The instrument shall be equipped with a high energy Echelle Cross Dispersion Spectrometer with a ?side by side? arrangement of prism and grating. Emission spectra shall be dispersed in both wavelength and order in a 2 dimensional array. 2. The optical purge shall be purged with either argon or nitrogen to allow measurement of signals in the low UV part of the spectrum. The instrument shall operate with a reduced purge flow of 2lpm and include a standby flow of 1lpm to minimize gas consumption. 3. Wavelength range. The instrument shall be able to operate over the range of 166.250 to 847.000 nm and cover the range of 166.250 ? 243.000 nm without interruption. In addition it should be possible to configure the instrument to cover the range of 193 ? 847 nm in a single measurement. All elements must be represented by at least 3 sensitive and 3 secondary lines to satisfy the requirements of a wide range of sample types. 4. Resolution. The instrument shall have the capability to perform measurements in routine operation with an optical resolution of better than 0.007nm at 200nm, 0.014nm at 400nm and 0.021nm at 600nm. The detection limits shall be measured at the quoted resolution. VI. Detection System 1. The instrument shall be equipped with a solid state Charge Injection Device capable of high contrast/low noise imaging and quantification of all wavelengths in the analytical range without saturation. The detector must be photoactive over the whole surface area for continuous wavelength coverage. It must contain a minimum of 540 x 540 pixels. 2. The Detector shall be cooled by a triple stage peltier cooling device to -45oC to reduce dark current and background noise resulting in enhanced detection limits. 3. Detector Operating Modes. The detector must be capable of operating in the following modes :- Analysis User selected analytical wavelengths are simultaneously integrated in a manner whereby the signal to noise ratio is optimized while the photo-generated charge level is maintained in the linear range of the device. This should be accomplished by allowing for the observation of the signal level on any pixel at any point in the exposure. If a pixel is determined to be nearing saturation, it shall be read out, cleared, the counts stored and the integration allowed to continue if the user selected time has not expired. If the detector pixel being interrogated is not nearing saturation, then it shall not be cleared, but allowed to continue accumulating counts until the next cycle, at which time the process shall be repeated. The clearing of any pixel shall not affect any other pixel. In this way, both very low and very bright lines can be measured during an analysis run. For every selected wavelength interval, peak and background measurements should be taken simultaneously. The detector must be capable of simultaneously measuring a set of elements together with multiple internal standard lines so that each analyte element can be paired with a suitable internal standard line. A minimum of 7 lines shall be selectable for use as internal standard lines. Full Frame Imaging - Allows for the spectrographic imaging of the entire spectrum in a matter of seconds for qualitative analysis and methods development. Additionally, the image shall be capable of being interrogated for the presence of any element and providing semi-quantitative data on the concentration of any element capable of being determined by ICP spectroscopy, whether or not that element was initially desired. The system must have the Intelliframe option which allows all lines to be presented in a single image without saturation. VII. Data System 1. The spectrometer shall be controlled from an industry-standard Pentium computer complete with CD-ROM/ (reader/writer) and 23? LCD monitor. The software supports all printers via the Windows 2000 or XP operating system. VIII. Software The instrument system software shall be based on the Windows 2000 Professional or XP operating system. The software shall provide full control of all instrument functions including plasma ignition, gas flows, viewing position, and monitoring of safety interlocks. It must include as a minimum the following features and capabilities: - -Full instrument control with the ability to display parameters and instrument response in real time -Fully automated system start up and shutdown via the instrument control window -Real time graphics for instrument setup and monitoring -All set up parameters including plasma position to be stored on disk. -Internal diagnostics including error checking and complete fault log. -Comprehensive wavelength library with indication of preferred line for each element. ----Automatic identification of possible spectral interferences when selecting wavelengths for analysis. Search mode for identification of unknown wavelengths. -Automatic selection of peak integration and background correction positions. Possibility of varying the size and location of the integration regions on a wavelength by wavelength basis. -Display of spectral information around the analytical wavelength and the possibility of overlaying multiple peaks. -Ability to modify the scale of the spectral display, zoom to a specific region and display the pixel data for easy identification of interference. -Ability to collect a full frame image for the entire spectrum along with user selected wavelengths for possible retrospective analysis. -Ability to select different plasma parameters for elements at high wavelengths to maximize performance for alkali elements and other routine elements in the same run. -Ability to maximize sample throughput by using a combination of intelligent rinse and auto sampler step ahead. The software also includes the option of a ?speed? or ?precision? mode to optimize spectrometer functions. -Automatic interference corrections should be available in all measurement modes including truly simultaneous background correction and internal standardization as well as interelement correction. -Full data reprocessing capabilities including editing samples, blanks, standards, calibration curves, elements, interference corrections and reporting parameters without the need to rerun samples -Linking of data to the method, a copy of the method used to measure any data shall be automatically saved along with the sample results. Any edits to the data shall cause an updated copy of the method to be saved. -Results output formatted in mixed concentration units e.g. ppb, ppm etc. and the ability to use element specific correction factors e.g. element to oxide, for ease of data interpretation by the user should be possible. -Fully integrated and user definable quality control software shall be included in the basic software suite provided with the spectrometer for automated QA/QC during unattended operation. -True multitasking operation ? can set up a new method whilst an automatic run is taking place. -Can open files from previous analyses whilst an automatic run is taking place without fear of overwriting existing data with current results -The software shall provide completely integrated and optimized use of accessories with the ICP. Communication shall be bi-directional such that if either the ICP or accessory fails the other device will stop the procedure and the instrument will return to a failsafe state. IX. Instrument Performance Provided the installation meets the requirements in the Pre Installation Guide the following minimum performance must be attainable :- Signal Stability ? Less than 1% change per hour measured at the claimed resolution. Wavelength stability ? Less than 1 picometer change over a 4 hour period Precision ? Relative standard deviation for 10 replicates of a solution with analyte concentrations 1000x the claimed detection limit shall be <0.5%. Detection Limits ? Detection limits are to be specified at the resolution that is claimed for the instrument. Element Detection Limit (micrograms/Liter) Ag 0.10 Al 0.034 As 0.98 Au 0.30 B 0.23 Ba 0.0099 Be 0.0072 Bi 1.1 Ca 0.0027 Cd 0.032 Ce 0.35 Co 0.18 Cr 0.099 Cs 326 Cu 0.25 Dy 0.061 Er 0.046 Eu 0.014 Fe 0.15 Ga 0.57 Gd 0.21 Ge 1.2 Hf 0.31 Hg 0.098 Ho 0.075 I 2 In 2 Ir 0.57 K 0.13 La 0.087 Li 0.008 Lu 0.018 Mg 0.0025 Mn 0.026 Mo 0.14 Na 0.062 Nb 0.24 Nd 0.20 Ni 0.17 Os 0.68 P 0.54 Pb 0.55 Pd 0.53 Pr 0.38 Pt 0.68 Rb 0.37 Re 0.17 Rh 0.80 Ru 0.34 S 1.4 Sb 0.95 Sc 0.0098 Se 0.77 Si 1 Sm 0.24 Sn 0.42 Sr 0.0031 Ta 0.72 Tb 0.19 Te 0.57 Th 0.56 Ti 0.062 Tl 0.50 Tm 0.077 U 1.1 V 0.15 W 0.25 Y 0.016 Yb 0.014 Zn 0.050 Zr 0.086 CLIN 02 ? LASER ABLATION SAMPLE SYSTEM: Specifications for a large beam (>750 micron) 266nm UV Laser Ablation System to be interfaced to an Inductively Coupled Plasma Spectrometer for Solid Sample in-situ Elemental Analysis 1. Laser Ablation System a. A dedicated low UV 266nm wavelength laser ablation system is required by the solicitation. b. The laser must be an internally homogenized 266 nm Nd:YAG laser with hybrid- resonator. Internal homogenization shall produce a flat beam profile. c. Energy output and adjustment via a motorized optical attenuator must be software controlled. d. Stimulated emission must be accomplished by gated Q-switching in the laser head. e. The optic magnification must be sufficient to provide an energy density of at least 15J/cm2 at the sample in aperture image mode. f. Laser pulse rate frequency must be selectable at 1,2,4,5,10 Hz. 2. Beam Delivery System a. The beam delivery system must include an attenuator to allow the continuous adjustment of laser energy via software control after the beam exits the laser formation area. b. The beam delivery system must include an aperture wheel to control the beam size with constant energy density when changing spot sizes. Aperture imaging must be accomplished through a minimum of 13 pre-calibrated; software controlled spot sizes ranging from 30-750?m in diameter. c. The beam delivery system shall also include the capability for extending the spot size range from 20 to >1200 ?m in diameter through focusing and de-focusing of the laser beam. 3. Sample Viewing Optics a. The laser ablation system must include a color CCD camera and frame grabber that may be operated from the mass spectrometer?s computer, not a separate computer. b. The viewing optics shall include at least a 2X objective for optical resolution of at least 10?m. c. Reflected and ring fiber optic illumination with built-in light source must be provided. 4. Sample Chamber and Sample Stage a. The sample chamber shall be cassette style and measure at least 60mm ID x 52 mm inside height for thin sections, thick sections, irregular specimens and standards. b. The sample stage must have 0.20?m resolution and travel up to 52mm in both the X & Y planes. The sample stage must have a calibration routine in the X & Y directions. c. The system-level laser safety must be of an Open Architecture Class 1 shield plus interlocks to accommodate exotic sample cells and direct viewing of the sample during ablation. 5. Software a. The laser ablation software must be Windows?NT, 98, 2000 and XP compatible. b. The laser ablation software must be able to operate on the ICP computer and monitor. c. Bi-directional control between the laser system and the ICP data collection software must be via TTL/CMOS compatible signal voltages or switch relay closures. d. ?Live? sample viewing during ablation must be possible. e. A ?Sample Mapping? function to image and display the entire sample for easy targeting of microfeatures must be provided. A virtual field of view of 50mm must be provided. f. All controls (GUI-graphic user interface) must be displayed on the same screen as the image of the sample. g. Cross-hair positioning must designate where the laser will ablate. h. A caliper tool for measuring lengths precisely with one click must be provided. i. Interlock windows must flag operator if a process is interrupted. j. Contrast, hue, color, brightness, and saturation adjustments must be available through the software. k. It must be possible to save and recall video images such as .BMP, TIFF, or JPEG files at full resolution for presentations and other off line use. l. 2D recoordination must be available to allow the reloading of samples and correct for rotation and/or translation in the XY plane from only 2 reference points. m. 3D recoordination must be available to correct for rotation, translation, and tilting (Z-tilt) of the sample from 3 reference points. n. Freeze video imaging must be available. o. Ablation pattern routines must be accessible through the software and cover the following methods of analysis: Single Point Analysis, Multi-Point Matrix, Raster scanning, Single-pass line, Multi-pass line, Transects, and Alpha numeric marking. p. Must demonstrate auto-sampling ability-targeting at least 100 spots and at least 10 lines or raster patterns simultaneously then editing the parameters of each feature (energy output, depth, spot size, scan rate) independently and run all 110 features in one non-stop experiment without pause and without involvement of the operator. 6. Recirculating Cooling System An air-cooled re-circulating water chiller shall be provided to cool the load coil, RF generator and detector components suitable for operation with an ambient temperature range +15oC to + 35oC. CLIN 03 ? INSTRUMENTATION TRAINING: On-site training at the Kennedy Space Center, FL. This notice is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation, which is issued as a Request for Quotation (RFQ); quotes are being requested and a written solicitation will not be issued. The Government intends to acquire a commercial item using FAR Part 12 and the Simplified Acquisition Procedures set forth in FAR Part 13. The NAICS Code and the small business size standard for this procurement are 334516 and 1000 employees respectively. The offeror shall state in their offer their size status for this procurement. All responsible sources may submit an offer which shall be considered by the agency. The Offeror shall provide a firm delivery date, FOB Destination, to the Kennedy Space Center, FL. The DPAS rating for this procurement is DO-C9. All contractual and technical questions must be in writing (e-mail or fax) to Marco Pochy not later than Wednesday, August 30, 2006. Telephone questions will not be accepted. Offers for the items(s) described above are due by Wednesday, September 06, 2006 at 4:00 PM EST via email to marco.l.pochy@nasa.gov or fax to (321)867-1141. Quotes must include, solicitation number, FOB destination to this Center, proposed delivery schedule, discount/payment terms, warranty duration (if applicable), taxpayer identification number (TIN), identification of any special commercial terms, and be signed by an authorized company representative. Offerors shall provide the information required by FAR 52.212-1 (JAN 2006), Instructions to Offerors-Commercial, which is incorporated by reference. If the end product(s) offered is other than domestic end product(s) as defined in the clause entitled "Buy American Act -- Supplies," the offeror shall so state and shall list the country of origin. The provisions and clauses in the RFQ are those in effect through FAC 2005-11. FAR 52.212-4 (SEPT 2005), Contract Terms and Conditions-Commercial Items is applicable. FAR 52.212-5 (FEB 2006), Contract Terms and Conditions Required To Implement Statutes or Executive Orders-Commercial Items is applicable. The FAR may be obtained via the Internet at URL: http://www.arnet.gov/far/ The NFS may be obtained via the Internet at URL: http://www.hq.nasa.gov/office/procurement/regs/nfstoc.htm Selection and award will be made to the lowest priced, technically acceptable offeror. Technical acceptability will be determined by review of information submitted by the offeror which must provide a description in sufficient detail to show that the product offered meets the Government's requirement. Offerors must include completed copies of the provision at 52.212-3, Offeror Representations and Certifications - Commercial Items with their offer. These may be obtained via the internet at URL: http://prod.nais.nasa.gov/eps/Templates/Commercial_Greater_Than_25K.doc . These representations and certifications will be incorporated by reference in any resultant contract. It is the quoter's responsibility to monitor this site for the release of amendments (if any) and acknowledge all amendments within their quote. Potential quoters will be responsible for downloading their own copy of this notice, the on-line RFQ and amendments (if any). An ombudsman has been appointed - See NASA Specific Note "B". Any referenced notes may be viewed at the following URLs link below.
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