SOLICITATION NOTICE
66 -- X-RAY SPECTROMETER
- Notice Date
- 10/10/2006
- Notice Type
- Solicitation Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- NASA Business Management Division, Acquisition Management Office, Code BA30, Stennis Space Center, MS 39529-6000
- ZIP Code
- 39529-6000
- Solicitation Number
- NNS06166192Q
- Response Due
- 10/25/2006
- Archive Date
- 10/10/2007
- Small Business Set-Aside
- N/A
- Description
- NASA Stennis Space Center (SSC) plans to issue a sole source contract to Rigaku for a Wavelength Dispersive X-Ray Fluorescence Spectrometer Analyzer, model ZSX Primus. Specification and salient characteristics- Spectrometer Specifications; The spectrometer shall incorporate a modular component design that permits a flexible layout of main equipment body, vacuum pumps, and secondary assembly composed of x-ray generator, data processor, and heat exchanger. A set of casters must be installed on both the spectrometer assembly and the secondary assembly so that both components may be moved easily and fit into tight spaces. X-ray Tube; The x-ray tube shall be end-window design with a Be window thickness of no more than 30?m in order to enhance light element sensitivity. The tube should have an Rh target with a min of4kW and be of a micro focus design. The x-ray tube shall be of a ?tube above? design in order to protect the x-ray tube from spills and/or sample degradation. High Voltage Generator; Rated Voltage & Current: 60kV, 150mA Upper Limit Output Power Rating: 4000 Watts Stability: ?0.005% at ?10% input variation for both current & voltage Set Values: 20kV ? 60kV x-ray tube voltages (1kV Increments) 2mA ? 150mA x-ray tube currents (1mA Increments) Protective Features: Abnormal temperature of secondary cooling water Abnormal conductivity of secondary cooling water Water failure relay/switch Tube voltage leakage X-ray indication lamp problem Over-voltage limit Under-voltage limit Tube current problem Primary Beam Filters: The spectrometer must contain a programmable primary beam filter system of not less than 5 positions with a filter configuration optimized for rhodium radiation to include the following filters: Zr for Analysis of Rh, Cd Al for Analysis of Cd-L? Ti for Analysis of Cr, Co, Fe, Zn Cu for Analysis of Pb, As Be To protect the tube window in liquid or loose powder analysis Limiting Area Diaphragm; A programmable limiting area diaphragm system with at least 6 positions is required. Diaphragm settings shall include 35mm, 30mm, 20mm, 10mm, 1mm, and 0.5mm. The 30mm diaphragm setting shall have an attenuator (one-tenth of x-ray intensity). Slit System; Divergent Slits: High Resolution Slit (Standard Position for Heavy Elements) Standard Resolution Slit (Standard Position for Light Elements) Extra Coarse Slit (High Sensitivity for Light Elements) Receiving Slit: High Resolution Receiving Slit for the Scintillation Counter Standard Resolution Silt for the Proportional Counter Sample Stage for General Purpose Analysis, Mapping, & Optimized Small Spot Size Analysis; The sample stage shall be an R-? sample stage that can rotate the sample around ? and move along its radius in order to position the sample for accurate programmed mapping and point analysis. The R-? sample stage must be able to position the sample so the spectrometer can perform measurements at the maximum x-ray intensity position while not being effected by uneven x-ray intensity of the x-ray tube or by uneven reflection in the crystal, even with small diameter spot sizes down to 0.5mm. In large area measurement such as 30mm window, the sample stage must be able to spin the sample. The X-ray system must be capable of being upgraded with a CCD Observation System; To enhance mapping and point analysis capability, the spectrometer must employ a CCD camera observation system. This system allows the user to get a CCD image of the sample surface on the PC for visual selection and identification of a specific spot to be analyzed. In specifying analysis spot(s), the user can direct the analysis position(s) by spot(s), line or area (rectangle). Each image is magnified and can be stored for later retrieval. Crystal Exchanger, Crystals, and Multilayer Materials; The spectrometer shall include a 10-position crystal exchanger equipped with at least 4 crystals. The crystal exchanger must be minimally fitted with the following crystals and multilayer materials: LiF200 (Ti-U) PET (Al, Si) Ge (P-Sc) RX25 (O-Mg) The following crystals and multilayer materials can also be equipped: LIF220 (Cr-U) RX40 (O and N) RX45 (N, high S/N ratio) RX61 (C and B) RX61F (C, the filter reduces O-K line interference) RX75 (B) RX80 (Be) Goniometer; The goniometer must also meet the following conditions: Drive Type: Pulse Motor (2-axis ?-2? independent driving) Scanning Range: Scintillation Counter 5? to 118? (2?) Flow Proportional Counter 13? to 148? (2?) Scanning Speed: Minimum 1400?/min (2?) Stepping Angles: 0.001?, 0.01?, 0.02?, 0.05?, and 0.1? Continuous Scan: 0.1? through 240?/min Reproducibility: Within ?0.0005? Sample Chamber & Vacuum System; The spectrometer must use a stable and rapid dual pump vacuum system. The design must maintain a stable vacuum during analysis, while facilitating efficient sample exchange. The chamber must employ a 2 position sample chamber turret with sample detection that holds the sample horizontal for top surface irradiation. All detectors must be inside the vacuum chamber. The vacuum chamber must also employ an automatic vacuum control device for ultimate stability when measuring light elements. Thermostatic Mechanism; The spectrometer shall have a thermostatic mechanism to control temperature inside the spectrometer cabinet and inside the sample chamber. Acceptable temperature control is as follows: Spectrometer Interior: 36.5?C ? 0.5?C Sample Chamber Interior: 36.5?C ? 0.1?C Detectors; Two detectors shall be employed: 1) Scintillation Counter, 2) Flow Proportional Counter. The flow proportional counter shall have the function of cleaning a center wire in order to re-gain resolution of the counter without opening the main body or the vacuum chamber. The flow rate of P10 gas shall be no more than 10 mL/min. Sealed proportional counters are not acceptable due to their short lifetimes and cost of replacement. Counting Electronics: The counting electronics must be a pulse height analyzer (PHA) employing a 2? pulse height linking method with peak shift correction and counting loss correction circuits. Automatic Sample Changer; An automatic and programmable sample changer of X-Y design must be included. The automatic sample changer must have a minimum of 48 positions with a minimum of 48 sample cups. For ease of operation, the design should offer trays that can be removed for loading while the spectrometer is running. 12 sample cups can be placed on each of these trays. Two trays should slide out onto a drawer for easy sample loading and removal for those people who cannot reach to the rear of the sample changer. Cooling System; The spectrometer shall have a cooling system with the ability to cool the x-ray tube while keeping it safe from overheating. The spectrometer must include two heat exchangers: Internal Heat Exchanger: Pure deionized water circulation that assures specific resistance in water using ion exchange resin must be provided. External Heat Exchanger: A backup, external heat exchanger that is refrigerated-water cooled and is sufficient to cool the 4kW x-ray tube must be provided. Safety; The spectrometer must be protected by integrated circuitry to monitor the status of the instrument and shut it down if the limits of any of its components are exceeded. An x-ray ?ON? light must be included and be visible from all directions surrounding the spectrometer cabinet. Software; Operating System: Microsoft Windows XP or Windows Vista Templates & Wizards: The software must employ a set of easy-to-follow Application Templates, containing information for sample preparation, with Wizards to guide the user through factory-created applications. It must also allow the user to set up a new template designed for any specific application. Qualitative Analysis: The ability to run a quick and easy qualitative measurement on a complete unknown sample without the need to set up a quantitative group of standards is required. The set up should only require input of preset information on elemental range, diaphragm size, oxide or metal, length of scan, atmosphere, and sample position. Semi-Quantitative Analysis: The software package must incorporate ?standardless? semi-quantitative analysis where qualitative scan analysis is carried out and then the automatically detected elements are quantified by a Fundamental Parameter method. The software must also incorporate corrections for the Photoelectric Effect, Line Overlapping, Chamber Atmosphere, and Film for Liquid Cells, and Impurities. Line overlapping must be performed automatically using theoretical intensities which can reduce analytical errors compared to using measured intensities. Semi-quantitative measurements should be able to be made by scan based or a combination of both scan based and peak - background based. The ability to use both a matrix matching library and a common library is required. The ability to automatically search and matrix match unknown spectra against stored sensitivities of reference materials for a higher degree of accuracy on semi-quantitative results Quantitative Analysis: The quantitative program shall include methods at least 120 components for bulk analysis and 7 layers / 120 components for thin film analysis. Calibration shall be able to done by empirical or Fundamental Parameter method, or a combination of both. For empirical calibration, matrix correction coefficients must be able to be calculated theoretically based on Fundamental Parameter method. Measurement conditions should be able to be optimized using 2?-scan and PHA-scan charts on the screen in the series of the quantitative analysis setting. Minimum Detection Limits: In hydraulic fluid, chlorine 10 ppm and iron 0.5ppm; 2 ppm Mg in Polymers; for ceramics (or rocks), fluorine 10 ppm, sodium, 4 ppm, sulfur 0.5 ppm and phosphorous 0.5ppm. The x-ray system should also be able to distinguish between high alloy steels (e.g., AISI 303 and 304 stainless). Mapping Software: The X-ray system must be capable of adding the Mapping Software: The software must be able to control the R-? sample stage to do programmed mapping of a sample. It should allow a single sample to be analyzed at selected and multiple R-? coordinates down to a spot size of 0.5mm. All results should be able to be displayed in 2-D or 3-D graphics for each and every element. Remote Diagnostics: Information on the instrument condition can be sent to the Service Department via telephone line or Rigaku has access to the instrument via remote control software. Instrument Controller: Dual Core or Pentium 4 processor 640 1GD SDRAM Optiplex GX520 MT w/ Resource CD 3.5? Diskette Drive Internal DVD-RW Drive Integrated Sound Integrated Intel DVMT Integrated Intel Pro/100 Cont: Integrated Microsoft Windows XP Pro SP2 Microsoft Office 2003 S.B.E. PS2 Serial Port Adaptor Norton Ghost or equivalent back-up Software PC-Hard Drive Serial ATA 80 GB w/ 8MB Buffer PC-Serial-ATA Signal Cable PC Anywhere (Symantec) ? Remote Diagnostics Software Ethernet Card 17? Color Monitor Keyboard, Mouse, & Pad HP DeskJet 6122 Color Printer or equivalent Standard Accessories; Acrylic Sample 4 Reference Samples (Ti, Mg, Al, Brass) Spare Flow Proportional Counter Window (1 Set) Instruction Manual in English (Paper & CD) Tool Box with Basic Tools NBS Handbook 111 Periodic Table of Elements Casters for Ease of Movement Training; The X-ray system will come with application and software training on-site and training for up to two people at a regularly scheduled XRF training class at the OEM?s site in the United States. 2-3 days of on-site basic operation and maintenance training by the Service Engineer is also required upon installation. Delivery; The spectrometer shall be delivered within 4-5 months after receipt of a purchase order. Installation; The X-ray system must come with installation of all equipment on-site upon delivery. The buyer will provide a suitable and safe environment, requisite electrical connections, plumbing connections for chilled water recirculation, P-10 gas for the flow proportional counter. Spectrometer Warranty; The spectrometer must be fully warranted for a 1-year period after acceptance. All warranty service shall include replacement parts (excluding consumables), labor, and travel at the bidder?s expense and be performed on-site during the warranty period. Support for hardware and software upgrades must also be included. X-ray Tube Warranty: The x-ray tube must be fully warranted for a 1-year period after acceptance. If the x-ray tube fails during the warranty period, it shall be replaced at no cost. Salient Characteristics 1.0 Fully automated sequential wavelength dispersive x-ray fluorescence (XRF) spectrometer that is capable of elemental recognition of all elements from Beryllium to Uranium when equipped with the proper crystals. 2.0 The spectrometer should be capable of performing qualitative, ?standard less? semi-quantitative and quantitative analyses by calibrated and Fundamental Parameter methods. 3.0 3500 to 4000 Watt X-Ray tube to incorporate a Be window thickness of no more than 30?m to enhance light element sensitivity. The tube should have an Rh target and be of a micro focus design. The x-ray tube shall be of a ?tube above? or equivalent design to protect the x-ray tube from spills and/or sample degradation and bubble formation in hydraulic fluids and other liquids. 4.0 The spectrometer must contain a programmable X-ray beam filter system of not less than 5 positions with a filter configuration optimized for rhodium radiation for the Analysis of Chlorine, Rh, Cd of Cd- L? of Cr, Co, Fe, Zn and Pb 5.0 A programmable limiting area diaphragm system with at least 6 positions is required. Diaphragm settings shall include 35mm, 30mm, 20mm, 10mm, 1mm, and 0.5mm. The30mm diaphragm setting shall have an attenuator (one-tenth of x-ray intensity). 6.0 The sample stage must rotate the sample 360 degrees and move along its radius to position the sample for accurate programmed mapping and point analysis. The sample stage must be able to position the sample so the spectrometer can perform measurements at the maximum x-ray intensity position while not being effected by uneven x-ray intensity of the x-ray tube or by uneven reflection in the crystal, even with small diameter spot sizes down to 0.5mm. In large area measurement such as 30mm window, the sample stage must be able to spin the sample. 7.0 The X-ray system must be capable of being upgraded with a CCD Observation System: To enhance mapping and point analysis capability, the spectrometer must employ a CCD camera observation system. This system allows the user to get a CCD image of the sample surface for digital visual selection and identification of a specific spot to be analyzed. In specifying analysis spot(s), the user can direct the analysis position(s) by spot(s), line or area (rectangle). Each image is magnified and can be stored for later retrieval. 8.0 The spectrometer shall include at least a 10-position crystal exchanger equipped with at least 4 crystals. The crystal exchanger must be minimally fitted for the analysis of multilayer materials: 1 (Ti-U) 2 (Al, Si) 3 (P-Sc) 4 (O-Mg) The following crystals and multilayer materials can also be equipped or added later by a service enginner: 5 (Cr-U) 6 (O and N) 7 (N, high S/N ratio) 8 (C and B) 9 (C, the filter reduces O-K line interference) 10 (Be) 9.0 The spectrometer must use a stable and rapid dual pump vacuum system. The design must maintain a stable vacuum during analysis, while facilitating efficient sample exchange. The spectrometer shall have a thermostatic mechanism to control temperature inside the spectrometer cabinet and inside the sample chamber. Acceptable temperature control is as follows: Spectrometer Interior: 36.5?C ? 0.5?C Sample Chamber Interior: 36.5?C ? 0.1?C 10.0 Two detectors shall be employed: 1) Scintillation Counter, 2) Flow Proportional Counter.The flow proportional counter shall have the function of cleaning a center wire in order to re-gain resolution of the counter without opening the main body or the vacuum chamber. The flow rate of P10 gas shall be no more than 10 mL/min. Sealed proportional counters are not acceptable due to their short lifetimes and cost of replacement. 11.0 The counting electronics must be a pulse height analyzer (PHA) employing a 2? pulse height linking method with peak shift correction and counting loss correction circuits. 12.0 A programmable sample changer of X-Y design must be included. The automatic sample changer must have a minimum of 48 positions with a minimum of 48 sample cups. For ease of operation, the design should offer trays that can be removed for loading while the spectrometer is running. 12 sample cups can be placed on each of these trays. 13.0 The spectrometer must be protected by integrated circuitry to monitor the status of the instrument and shut it down if the limits of any of its components are exceeded. An x-ray ?ON? light must be included and be visible from all directions surrounding the spectrometer cabinet. 14.0 Quantitative Analysis: PC based Instrument controller with color printer The quantitative program shall include methods for at least 150 components for bulk analysis and a min of 10 layers / 150 components for thin film analysis. The ability to run qualitative measurements on a complete unknown sample without the need to set up a quantitative group of standards is required. The software package must incorporate ?standardless? semi-quantitative analysis where qualitative scan analysis is carried out and then the automatically detected elements are quantified by a Fundamental Parameter method. The software must also incorporate corrections for the Photoelectric Effect, Line Overlapping, Chamber Atmosphere, and Film for Liquid Cells, and Impurities. Line overlapping must be performed automatically using theoretical intensities. The ability to use both a matrix matching library and a common library is required. The ability to automatically search and matrix match unknown spectra against stored sensitivities of reference materials for a higher degree of accuracy on semi-quantitative results 15.0 The X-ray system must be capable of adding the Mapping Software: The software must be able to control sample stage to do programmed mapping of a sample. It should allow a single sample to be analyzed at selected and multiple coordinates All results should be able to be displayed in 2-D or 3-D graphics for each and every element. This is a sole source commercial item acquisition under FAR Part 12 and 6.302-1. The Government believes only one responsible source can provide the supplies that will satisfy the Agency's requirements. This notice of intent is not a Request for (RFQ) Quotes. Interested organizations may submit their capabilities and qualifications to perform the effort in writing to the identified point of contact not later than 3:00 p.m. (central time) on October 25, 2006. Submissions will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. Oral communications are not acceptable in response to this notice. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the Government. This acquisition is unrestricted. The NAICS Code and Size Standard are 334516 and 500 employees respectively. FOB is destination. The anticipated release date of this RFQ is on or about October 25, 06 with responses due NLT 3:00 p.m. November 8, 2006. An Ombudsman has been appointed. See NASA Specific Note "B". Any referenced notes can be viewed at the following URL: http://genesis.gsfc.nasa.gov/nasanote.html .
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