SOURCES SOUGHT
66 -- Scanning Electron Microscope
- Notice Date
- 12/21/2006
- Notice Type
- Sources Sought
- NAICS
- 339111
— Laboratory Apparatus and Furniture Manufacturing
- Contracting Office
- Department of Energy, Brookhaven National Laboratory (DOE Contractor), Brookhaven, PO Box 5000 Bldg. No. 355, Upton, NY, 11973, UNITED STATES
- ZIP Code
- 00000
- Solicitation Number
- SEM116545
- Response Due
- 1/19/2007
- Archive Date
- 2/3/2007
- Description
- Brookhaven Science Associates plans to acquire a Scanning Electron Microscope (SEM) system for the Center for Functional Nanomaterials (CFN) at Brookhaven National Laboratory The SEM emitter source will be a Schottky thermal field-emitter type, and the tool will be capable of imaging samples using accelerating voltages from 0.1kV to 30kV, and probe currents from between 10pA to 10nA. The instrument will include an automated procedure for energizing the emitter tip, and automatic emitter shutoff. The instrument will be capable of imaging resolutions of less than 1.5nm operating at accelerating voltage of 15kV (working distance 2mm), and less than 2.5nm at 1kV (working distance 2mm). High resolution is to be maintained over the entire accelerating voltage range. Resolution tests are to be performed on-site prior to user tool acceptance. . Equipment: Vendors must supply detailed descriptions and dimensioned layout drawings of the Scanning Electron Microscope system, the materials used in its construction, failure rate data and, where applicable, manufacturer?s specifications of subsystems such as vacuum pumps, gas flow controllers, and micromanipulators. The vendors proposed system will be evaluated for operational reliability, quality of construction, the ability to meet or exceed the specification parameters and cost. 1. General 1.1 Operating Voltage/Current 1.2 Microscope Resolution. 1.3 Magnification: 1.4 Detectors: 1.5 Specimen Stage: 1.6 Specimen Chamber: 1.7 Vacuum System. 1.8 Sample exchange 1.9 Specimen holders 1.10 Metrology tools 1.11 Facilities: 2. Performance Risk 2.1 SEM production and installations 2.2 Relevant Experience 2.3 Quality of Work 2.4 Timeliness of Performance 3. Other Requirements 3.1 Operating Manuals 3.2 Warranty 3.3 Service Contract 3.4 Spare Parts List 3.5 Training Proposals are due January 19, 2007 by 4:00 PM, EDT, and shall be submitted to Brookhaven Science Associates, Brookhaven National Laboratory, Attention: D. Paveglio, Bldg. 355, Upton, NY 11973, by US mail This RFP has been sent to the following known manufacturers: Hitachi Electron Microscope Division, 940 Clopper Road, Suite 44, Gaithersburg, MD 20878 Jeol USA, Inc.11 Dearborn Road, Peabody, MA 01960 FEI Company, 257 Loring Avenue, Salem, MA 01970 Carl Zeiss, One Zeiss Drive, Thornwood, NY 10594 All other interested vendors may down load Request for Proposal SEM106699 from this website or contact David J. Paveglio.
- Place of Performance
- Address: Brookhaven National Laboratory, Upton, NY
- Zip Code: 11973
- Country: UNITED STATES
- Zip Code: 11973
- Record
- SN01200993-W 20061223/061221220241 (fbodaily.com)
- Source
-
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