SOLICITATION NOTICE
66 -- SCANNING ELECTRON MICROSCOPE
- Notice Date
- 7/10/2007
- Notice Type
- Solicitation Notice
- Contracting Office
- 3610 Collins Ferry Road (MS-I07) P.O. Box 880 Morgantown, WV
- ZIP Code
- 00000
- Solicitation Number
- DE-RQ26-07NT00606
- Response Due
- 7/25/2007
- Archive Date
- 1/25/2008
- Small Business Set-Aside
- N/A
- Description
- SUBJECT: SCANNING ELECTRON MICROSCOPE This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Part 13, Simplified Acquisitions, as supplemented with additional information included in this notice. QUOTES ARE BEING REQUESTED. Responses shall reference Request for Quotations No. DE-RQ26-07NT00606 the U.S. Department of Energy, National Energy Technology Laboratory (NETL), Pittsburgh, PA (for delivery to the Albany Research Center, Albany, OR) intends to purchase the following: Scanning electron Microscope (1 each) with the following specifications. Specifications: NETL has an immediate need for a scanning electron microscope (SEM) with the capabilities to perform high quality secondary electron imaging, backscattered electron imaging and X-ray energy dispersive spectroscopy (XEDS) analyses. It will have maximum flexibility for supporting a wide range of DOE and NETL research projects, including the development of advanced metallic, ceramic and composite materials for combustion and gasification environments; characterization of feed stocks and products of CO2 sequestration; characterization of materials exposed to high-temperature corrosive and erosive environments, etc. The instrument will be delivered to NETL at 1450 Queen Ave., S.W. Albany, OR 97321. Electron Optics, Specimen Chamber, and Stage The instrument will be equipped with a field emission gun assembly with a Schottky emitter source, capable of a selectable acceleration voltage from 200V to 30kV, and a stable beam current. The instrument will have a pre-aligned electron optical column. The instrument will include the following detectors, with sufficient ports for their simultaneous mounting and operation: (a) secondary electron (SE) detector. (b) backscattered electron (BSE) detector. (c) X-ray detector for Energy Dispersive Spectroscopy (XEDS). (d) CCD-TV camera with illumination for visualization of the sample and pole piece while the SEM is under vacuum. The SEM will be equipped with a motorized x-y-z-rotating stage. The specimen stage must have a minimum of 50 mm movement in the x direction, 50 mm movement in the y direction, 50 mm movement in the z direction, continuous 360 degree sample rotation, and at least -15 to +70 degrees tilt. The instrument must be capable of storing and relocating multiple stage positions. The stage will be able to accommodate a sample size of 4 inches diameter by 2 inches in height. SE and BSE Detectors and Imaging The instrument must include a secondary electron (SE) detector with a variable grid bias. The instrument must include a solid-state backscattered electron (BSE) detector. The BSE detector will consist of a minimum of two segments that can be switched for the sum, or difference in signal to enhance atomic number contrast or topological features. The resolution of the atomic number contrast will be better than 0.1 delta atomic number at Z = 29. The BSE detector must be capable of imaging at acceleration voltages ranging from 5kV to 30kV. The scanning system will have a selectable pixel density of up to 4096 x 3536, or greater, with a range of selectable scan speeds. The scan will be capable of electronically rotating the image through 360 degrees. The instrument will be able to produce images from a magnification of 20x, or lower, up to at least 500,000x. The focus range will be from 3 mm to 99 mm. The minimum acceptable instrument resolution will be 1.2 nm at 30 kV and 3.0 nm at 1 kV, determined by imaging gold particles on a carbon substrate. Images generated during operation of the instrument will be displayed on a minimum 19?? LCD monitor in a single frame area of 1280 x 1024 pixels. These images will be able to be exported to a printer from the instrument??s graphical user interface. Generated images will be savable from the graphical user interface in TIFF (8-bit or 16-bit), BMP and JPEG file formats to a hard drive, CD/DVD and the NETL- LAN. Vacuum System The instrument??s specimen chamber will be equipped with a pumping system that attains a working vacuum in 2.5 minutes, or less. The vacuum pressure in the specimen chamber will be 6x10-4 Pa, or better. X-ray Energy Dispersive Spectrometer (XEDS) for MicroAnalysis The XEDS detector will be Liquid Nitrogen Free, and will contain a light element window (or thin window design) for the detection of elements with atomic numbers equal to Boron (Z = 5) and greater. Guaranteed spectrometer resolution will be equal to or better than 133 eV at the Mn K?? line, and 75 eV at the F K?? line, at a count rate of 20,000 counts per second (cps). The microanalysis software will be capable of standard and standardless quantitative, and semi-quantitative analyses. Algorithms will be included that detect peak shape and position to accurately identify all elements where peaks overlap. The results of the microanalyses willll be exportable to a printer, and also to hard drives, DVD/CD, and the NETL LAN system. System Control and Support The computer system(s) (hardware and software) for controlling the SEM, the SEM graphical interface, and the XEDS system will be provided. The support computer system will be able to host third party software/hardware that is not part of the microscope. Any compressors and water chillers required to operate the SEM within the requested specifications will be provided. Installation and Training Full installation, and verification of performance, of the SEM and XEDS systems will be provided by this contract. Training on the basic operation of the SEM and XEDS systems will also be provided. System Warranty A 12-month warranty on the complete system is to be included as a part of this purchase. Safety Requirements The operator will be fully protected from X-rays generated by the SEM. Instrument must be fully protected against power line failure and voltage drop (brown out). Instrument must be fully protected against cooling system failure. DELIVERY: FOB Destination is required (all freight included). The provisions at 52.212-2 Evaluation ?V Commercial Items (JAN 1999) does not apply to this acquisition. Instead, the following information will be used for evaluation of offerors: An award shall be made to the responsible offeror submitting a technically acceptable quote and offering the lowest evaluated price. Evaluation is based on best value including cost and ability to meet stated requirements above. Offerors shall submit descriptive literature and drawings detailing features, technical capabilities and warranty data. Technical acceptability will be determined solely on the content and merit of the information submitted response to this provision as it compares to the minimum characteristics provided above. Therefore, it is essential that offerors provide sufficient technical literature, documentation, etc., in order for the Government evaluation team to make an adequate technical assessment of the quote as meeting technical acceptability. Price shall be the deciding factor among technically acceptable quotes. The North American Industry Classification (NIAC) is 334516. ALL INTERESTED PARTIES SHALL SUBMIT OFFERS WITH THE FOLLOWING INFORMATION: Federal Tax Identification (TIN); Dun & Bradstreet Number (DUNS); and remit to address if different. A Firm Fixed Priced Purchase Order shall be issued using the Simplified Acquisition Procedures FAR Part 13. Responses/offers are due no later than 5:30 p.m. Eastern Time Zone on July 25, 2007. Quotes may be faxed to Mr. Robert Mohn, at 412-386-5770 or E-mailed mohn@netl.doe.gov. All technical questions should be directed to the Technical Representatives Mr. David Alman, at 541-967-5885.
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