SOURCES SOUGHT
66 -- Sources Sought for Maintenance and Urgent Repair Support for NIST Owned FEI Electron Microscopes
- Notice Date
- 5/18/2012
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- AMD-12-SS29
- Archive Date
- 6/19/2012
- Point of Contact
- Todd D Hill, Phone: 301-975-8802
- E-Mail Address
-
todd.hill@nist.gov
(todd.hill@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing a service agreement for the service and maintenance of two (2) Nova TM NanoLab TM 600 systems, one (1) NanoSEM TM 600, three (3) Helios TM NanoLab TM 650 systems, four (4) Titan TM 80-300 systems, one (1) CM TM 300 FEG, one (1) Quanta TM 200F, one (1) EM TM 400T, one (1) Quanta TM 600, one (1) Sirion TM 400 SEM, and their associated components to ensure uninterrupted performance within manufacturers' specifications on a scheduled and as-needed basis. The total number of electron microscopes under this service agreement is anticipated to be fifteen (15). The service agreement will include accessories with each of the electron microscopes. After results of this market research are obtained and analyzed and complete specifications are developed for the service agreement for the FEI microscopes and their accessories that can meet NIST's minimum requirements, NIST may conduct a competitive procurement and subsequently award a Purchase Order. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside. NIST has a need for a service agreement to ensure uninterrupted performance within manufacturers' specifications, on a scheduled and as-needed basis, for each of the FEI microscopes and accessories listed below: a. Nova NanoLab 600, Serial number D61 (Division 637) to include Autoprobe 200, Oxford INCA x-sight XMax 80mm2 SDD (SN 38212) and Oxford Nordlys 2S EBSD system (SN NL02-1734-02). b. Helios NanoLab 600, Serial number D400 (Division 683), includes a high resolution FEG Elstar electron column, a Sidewinder ion column, Platinum Deposition, FEI BSE, and STEM detector, Scandium Image Software, AutoFIB, AutoTEM, AutoSlice&View G, and cryo-stage and Fjeld laser-interferometer- equipped sample stage system, Bruker EDS silicon drift detector and Quantax microanalysis system. c. Helios NanoLab 650, Serial number D9467 (Division 637) to include EDAX TEAM EDS system with Apollo XL 30 mm2 SDD (SN 2321), EDAX OIM XM 4 EBSD system (SN 1257), Autoprobe 200.2 (SN ADV 220334RO). The Helios NanoLab 650 is also equipped with the following third party accessories that do not fall under the responsibility of FEI but rely upon communication with the microscope to operate correctly: Gatan model MonoCL4 elite cathodoluminescence system with LN2-cooled 1024 array IR camera. d. NanoLab 650, Serial number 9920003 and 9920008 (Division 620) to include: 1) Retractable STEM detector (quantity 2), Charge Neutralizer (quantity 2), ICE Detector (quantity 2), Fast Beam Blanker (quantity 2), and NavCam Optical Camera (quantity 2) 2) Gas Injector Systems: two (2) Platinum Deposition, two (2) Insulator Deposition II, two (2) Insulator Enhanced Etch, two (2) Carbon Deposition, one (1) Gold Deposition, one (1) Selective Carbon Mill 3) Software Packages: two (2) AutoFIB, two (2) AutoTEM, two (2) AutoSlice and View G2, two (2) Nanobuilder Scandium Image Software 4) One (1) Oxford X-Max 80 mm2 EDS system (S/N 57832) with INCA 350 software 5) One (1) Omniprobe AutoProbe 300 with rotation system 6) One (1) Omniprobe AutoProbe 200 system 7) One (1) Kleindiek 4MM3a-EM Nanoprobing system e. Nova NanoSEM 600, Serial number D7974 (Division 683) includes a Fjeld laser-interferometer- equipped wafer and mask metrology scanning electron microscope with a high-resolution FEG electron column, two ESEM detectors, 4Pi image acquisition system, custom imaging and measurement systems. f. Sirion400 SEM, Serial number D1629 (Division 686) to include: 1) An anti-contamination device 2) A lithography system (http://www.jcnabity.com/) g. Titan TM 80-300, Serial number D3094 (Division 637) to include: 1) Titan 80-300 ST STEM/TEM, Serial number D3094 2) FEG / Monochromator Unit with High Tension Generator 3) Lorentz Lens, Serial number 4) CEOS-design Hexapole Cs Probe Aberration Corrector, Serial number 04.EP.3.02.E 5) Digital Camera, Gatan MultiScan TM 794, Serial number 05101301 6) Annular Dark-Field Detector, Fischione 3000, Serial number 300-073 7) Fischione retractable annular dark-field (ADF) STEM detector, model 3000 8) On-axis Bright-Field / Dark-Field STEM Detector, Gatan 805 9) EDAX retractable energy-dispersive x-ray spectrometer and pulse processor 10) Imaging Energy Filter, Gatan Tridiem 865, Serial number 07030210 h. Titan TM 80-300, Serial number D3188 (Division 655) to include: 1) Titan 80-300 ST STEM/TEM, Serial number: D3188 2) HT Generator Std 300kV, Serial number: D3188.1 3) FEG Unit 300kV Std, Serial number: D3188.2 4) Lorentz Lens, Serial number: D3188.3 5) EDAX Pulse Processor, Serial number: D3188.4 6) R-TEM SUTW, Serial number: D3188.5 7) STEM Package 300kv, Serial number: D3188.9 8) Gatan 894 UltraScan, Serial number: D3188.8 9) Electron Energy Loss Spectrometer, Gatan Enfina 776.P7630, Serial number 09052701W0776 10) Annular Dark-field Detector, Fischione Model 3000, Serial number 300-200 11) Software, Tomography, Serial number: D3188.6 12) TrueImage Prof. Titan, Serial number: D3188.7 i. Titan TM 80-300, Serial number D3226 (Division 620.01) to include: 1) Titan 80-300 ST STEM/TEM, Serial number: D3226 2) HT generator, 300kV Std, Serial number 3) FEG Unit 300kV Std, Serial number 4) Digital Camera, Gatan Orius SC200, Serial number 100610036W0830 5) Gatan imaging filter (GIF), Model 994, Serial number 10041901W0994 6) Annular Dark-field Detector, Fischione Model 3000, Serial number 300-320 7) EDAX retractable energy-dispersive x-ray spectrometer and pulse processor, Serial number 13031 8) R-TEM SUTW, Serial number 9) STEM Package 300kv, Serial number 10) STEM Tomography Data Acquisition Software j. Titan TM 80-300, Serial number D3263 (Division 620.03) shall be maintained/repaired for six (6) months during the base year of this requirement. This Titan TM 80-300 includes: 1) Titan 80-300 ST STEM/TEM, Serial number: D3263 2) HT generator, 300kV, high stability, Serial number: 3) XFEG Unit 300kV, with monochromator, Serial number: 4) CEOS-design Cs Image Aberration Corrector, Serial number 5) Lorentz Lens, Serial number 6) Digital Camera, Gatan UltraScan US1000 XP, 11042801W0994 7) Gatan Imaging Filter (GIF), Model 966, Serial number 11040401W0994 8) Annular Dark-field Detector, Fischione Model 3000, Serial number 300-200 9) EDAX retractable energy-dispersive x-ray spectrometer and pulse processor, Model PV97-61850ME, Serial number 13081 10) R-TEM SUTW, Serial number 11) STEM Package 300kv, Serial number 12) On-axis Bright-Field / Dark-Field STEM Detector, Serial number 13) Titan ETEM Package, Serial number 14) STEM Tomography Data Acquisition Software k. CM 300F EFTEM, Serial number D687 (Division 637) l. Quanta 200F, Serial number D8439 (Division 637). This Quanta 200F includes: 1) Peltier stage (Wet STEM), Serial number D8439.1 2) Backscatter detector, Serial number D8439.2 3) Solid State STEM detector, Serial number D8439.3 4) Support computer 5) Gaseous analytical detector (GAD) 6) Large field detector (LFD) 7) Gaseous Backscatter detector (GBSD) 8) Gaseous secondary electron detector (GSED) The Quanta is also equipped with the following third party accessories that do not fall under the responsibility of FEI but rely upon communication with the microscope to operate correctly: • Bruker AXS model 5030 silicon drift detector and Quantax microanalysis system, Serial number 1814. • Gatan model MonoCL4 elite cathodoluminescence system with high sensitivity PMT and TE cooled back illuminated CCD. m. EM400T Serial number D979 (Division 654). This EM400T includes a water chiller system. n. Quanta 600 has a standard tungsten source, Serial number D7729 (Division 731). NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your company's size classification and socio-economic status in any response to this notice. Companies that could provide such services are requested to email a detailed report describing their abilities to todd.hill@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your services or capabilities.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/AMD-12-SS29/listing.html)
- Place of Performance
- Address: NIST, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN02752871-W 20120520/120519001018-219cb87e30121fcab3cb64546fe5f090 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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