AWARD
J -- REPAIR MICROFOCUS COMPUTED TOMOGRAPHY X-RAY SYSTEM- X-TEK HMXST 225
- Notice Date
- 8/23/2012
- Notice Type
- Award Notice
- NAICS
- 334513
— Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Industrial Process Variables
- Contracting Office
- NASA/Langley Research Center, Mail Stop 12, Industry Assistance Office, Hampton,VA 23681-0001
- ZIP Code
- 23681-0001
- Solicitation Number
- NNL124200439007Q
- Response Due
- 8/7/2012
- Archive Date
- 7/23/2013
- Point of Contact
- Karen Fallon, Contract Specialist, Phone 757-864-4545, Fax 757-864-7709, Email karen.fallon@nasa.gov
- E-Mail Address
-
Karen Fallon
(karen.fallon@nasa.gov)
- Small Business Set-Aside
- N/A
- Award Number
- NNL12AA41C
- Award Date
- 8/22/2012
- Awardee
- NIKON Metrology, Inc 12701 Grand River Ave Brighton, MI 48116-8506
- Award Amount
- $156,300.00
- Description
- No Description Provided
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/NASA/LaRC/OPDC20220/NNL124200439007Q/listing.html)
- Record
- SN02852883-W 20120825/120824001043-e1462933a8ab0caa278408517d9a2257 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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