SOLICITATION NOTICE
66 -- Mechanical Tester/Stage for SEM
- Notice Date
- 10/5/2012
- Notice Type
- Combined Synopsis/Solicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- N62271 Naval Postgraduate School 1 University Circle Monterey, CA
- ZIP Code
- 00000
- Solicitation Number
- N6227113Q1003
- Response Due
- 10/16/2012
- Archive Date
- 10/31/2012
- Point of Contact
- Robert B Gallagher 8316567853
- Small Business Set-Aside
- N/A
- Description
- The Materials Science and Engineering field has seen in recent years a strong tendency to study materials that require properties linked to having a large fraction of surface atoms, as is the case of nanomaterials. Nanomaterials are formally defined as materials with features in the 100nm scale (1nm=10-9 m) and their properties differ from those of their bulk counterparts. At NPS, we are generating and characterizing nanomaterials such as Carbon Nanofibers (CNF), Carbon Nanotubes (CNT), Ceramics with Nanometer features (graphene, WS2 inorganic fullerenes) and metallic nanostructures, among others, as key ingredients in composites for armor applications. The characterization of those materials, ca. their morphological features (size, shape), is usually conducted with the aid of electron microscopes, which can provide information with resolution at those length scales. The mechanical properties of these materials have been studied by either methods traditionally used to analyze bulk materials or by Nanoindentation, when nanomaterials are part of a matrix or as a consolidated, compressed solid. Unfortunately, none of those options provide means to perform both: mechanical properties measurement and study of morphology at nanometer scale. We have been seeking an interface that will allow us to study the material under tension or compressive loads while observing it under the scanning electron microscope. Basically, we need a Tensile/Compressive test stage for SEM. The stage to test the materials is to be fitted inside the Scanning Electron Microscope sample chamber, so it needs to be compact, include a servo control automatic motor, be provided with software to operate it and fulfill the rest of requirements outlined in the RFQ. Please see the attached RFQ for requirements. Please send you question(s) and quote to Robert B Gallagher at rbgallag@nps.edu
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/notices/921f32aaa8b23fcaf40d6fe853219575)
- Record
- SN02909501-W 20121007/121005234004-921f32aaa8b23fcaf40d6fe853219575 (fbodaily.com)
- Source
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