SPECIAL NOTICE
66 -- Atomic Force Microscope
- Notice Date
- 6/23/2020 3:37:45 PM
- Notice Type
- Special Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- FA7000 10 CONS LGC USAF ACADEMY CO 80840-2303 USA
- ZIP Code
- 80840-2303
- Solicitation Number
- FA700020Q0092
- Response Due
- 7/12/2020 11:30:00 AM
- Archive Date
- 07/27/2020
- Point of Contact
- Melissa A. Staudacher, Phone: 719.333.4504, Ryan A. Mavis, Phone: 719.333.8265
- E-Mail Address
-
melissa.staudacher@us.af.mil, ryan.mavis.2@us.af.mil
(melissa.staudacher@us.af.mil, ryan.mavis.2@us.af.mil)
- Description
- Notice of Intent to Sole Source This is a special notice is prepared in accordance with Federal Acquisition Regulation (FAR) subpart 5.2 - Synopses of Proposed Contract Actions. The contracting office for this notice is the 10th Contracting Squadron, USAF Academy, CO 80840. The US Air Force Academy (USAFA) intends to award a sole source commercial contract using simplified procedures in accordance with FAR parts 12 & 13 to Park Systems, Inc. Park Systems, Inc. is a large business located at 3040 Olcott St., Santa Clara, CA 95054-3207. The authority for this non-competitive award is 10 USC 2304(c)(1), only one responsible source. The NAICS code for this requirement is 334516. The size standard as defined by the U.S. Small Business Administration is 1,000 employees. This notice incorporates provisions and clauses that are in effect through Federal Acquisition Circular FAC 2020-06 effective 6 May 2020. The Government has deemed Park Systems, Inc. to be a responsible contractor with respect to performance. a.�� Only one responsible source and no other item will satisfy the USAFA requirement. b.�� The USAFA Department of Chemistry (DFC) has a requirement to purchase one complete Atomic Force Microscope (AFM) system capable of imaging and measuring nanomaterial samples with sub-nanometer resolution. This AFM System is used in support of various cadet chemistry classes, cadet capstone and research programs. This system will also enable to the school to meet and maintain the American Chemical Society (ACS) accreditation. c.�� The Atomic Force Microscope (AFM) is a complete system capable of imaging and measuring nanomaterial samples with sub-nanometer resolution. The system provided should be a complete system inclusive of all necessary items, such as computers, software, hardware, and accessories for all the specified imaging modes. The Atomic Force Microscope must meet the specifications and requirements as stated below: Basic System Requirements. At a minimum, the basic system components include: Main unit with standard topographic imaging modes: contact mode, resonant tapping mode and non-contact mode Must have minimum resolution of 5k x 5k Noise must be less than 50 pm Must be able to image surfaces at less than 5 nm resolution Automated scan control which optimizes the scan condition without losing data quality or involving special operational modes System must accommodate large samples sizes at� 50 x 50 x 20 mm (xyz) or greater Must have a motorised XY-stage and a motorized Z-stage PC and Software for data acquisition and analysis Standard Modes. At a minimum, the standard modes must include: Contact mode AFM, Intermittent (tapping, soft dynamic, or AC) mode AFM, Non-Contact mode AFM, Phase Imaging Lateral Force Microscopy (LFM), Force Distance (F-D) Spectroscopy, Force Distance Volume Mapping � Advanced Modes. At a minimum, the advanced modes must include: A Nanomechanical Mode with cantilevers required to measure in this mode At a minimum, must have the ability to measure mechanical properties such as stiffness and young�s modulus Adhesion force maps should be acquired simultaneously with topography in real-time from high-speed force-distance curves Chemical Force Microscopy mode with cantilevers required to measure in this mode System must be able to operate in the following advanced modes with the additional accessories and cantilevers required to measure in each respective mode: Magnetic Force Microscopy Kelvin Probe Force Microscopy Piezoelectric Force Microscopy Nanoindentation Nanolithography � AFM Head. At a minimum, the AFM Head must: Ability for single-head interoperability in various advanced modes without requiring the head to be swapped out between modes Have an AFM head and software which allows cantilever oscillation frequencies up to 3 MHz Have the capability to be positioned repeatedly upon its removal and reinsertion, so that the probe is positioned at the same position after the insertion within less than 100 �m deviation � Sample. At a minimum, the system must: Support a sample size up to 100 mm X 100 mm, 20 mm thickness Have an allowable sample weight up to 500 g Have a software-controlled bias voltage between -10 to 10 V which can be applied to the sample � XY & Z Scanner and Stages. At a minimum, the system must: Have an XY scanner and Z scanner which is capable of both open loop and closed-loop operation Include X and Y scanner movement should be mechanically decoupled and independent from each other. The Z-scanner, which controls the vertical movement of the atomic force microscope tip, must be completely separated from the XY-scanner which moves the sample laterally Include software controlled and motorized XY stage with at least 20 mm x 20 mm travel range and minimum step size of ~0.5 um Have an XY scanner scan range of at least 50 ?m Include software controlled and motorized Z stage with at least 20 mm travel range with a minimum step-size of ~0.08 um Have a motorized Z scan range of at least 15 ?m or better Have a Z scanner with a resonance frequency 9 kHz or better Have a separate motorized optical focus stage on the AFM system that is synchronized to the Z-stage Allow an automated tip approach within 10 seconds at more than 1 mm away without tip or sample damage � Cantilevers/Probes and Camera. At a minimum, the system: Must allow for easy tip and sample exchange. Cantilever must be ready for scanning without laser alignment by using pre-aligned cantilevers mounted on the cantilever tip holder Probe tip exchange must be capable without requiring special tools or AFM head removal using a magnetic kinematic mount Must allow users to mount and operate cantilever(s) purchased from 3rd party vendors Must provide on-axis top view of sample and cantilever Must provide LED illumination with software-controlled intensity � AFM Controller, PC and Software. At a minimum, the system must: Contain an AFM controller with a high performance processing unit and a minimum of 3 built-in digital lock-in amplifiers Have a controller with built-in digital outputs for triggering, i.e.:� Pixel, Line, Image frame, tip-bias modulation Have a controller capable of enabling the simultaneous acquisition of up to 16 images Have a controller capable of enabling the acquisition of images up to 4096 � 4096 pixels A PC with the following specifications or better: Intel(R) Core(TM) i7 CPU or compatible Dual 23 inch LED monitors (1920 � 1080 pixel, DVI) Operating System: Microsoft Windows 10 Professional 64 bit (English) Have separate software packages for data analysis and data acquisition Have data acquisition and imaging processing programs with the capability to run/operate simultaneously Have seamless data transfer to the analysis software � Data analysis software. Must have: Ability to run on external Windows 10 PCs �Copy to Clipboard� function for convenient presentation editing Able to perform standard AFM analysis functions to include profile tracer, line measurement of height, line profile, power spectrum, average roughness, volume, surface area, Ry, Rz, grain analysis etc. � Accessories and Additional Requirements: An acoustic enclosure must be supplied together with the AFM. It should be environmentally sealed to block external acoustic and light noise AFM must come with a vibration isolation system that provides active vibration isolation to cancel out the floor vibration. The vibration isolation system must not require a pressurized gas supply Any additional hardware required to operate the AFM should also be included (PC, modem, keyboard, power cables etc.) A 1-year warranty must be included An operators manual, either as a hard copy or electronic PDF, are required Installation and on-site training are required In our past and ongoing search we have found only one company which can supply an Atomic Force Microscope System with the above specifications, namely Park Systems, Inc. As such, there is only solution that meets USAFA�s requirement. Therefore, the contracting officer has determined that the circumstances of the contract action deem only one source reasonably available IAW FAR 13.106-1(b)(1). A SOLICITATION WILL NOT BE POSTED. Based on previous market research conducted, the Government intends to proceed with this sole source action. This synopsis is for informational purposes only and does not constitute a solicitation for bids or proposals.� DO NOT submit a bid/quote at this time. All responsible sources may submit a capability statement. Interested concerns must show clear and convincing evidence that competition of this requirement would be advantageous to the Government. Oral communications are not acceptable in response to this notice. A determination by the Government not to compete this proposed requirement is solely within the discretion of the Government. Responses and questions shall be submitted to melissa.staudacher@us.af.mil no later than 12:30pm, MST on 1 July 2020. Responses received after this will be considered late IAW FAR 52.212-1(f) and will not be evaluated. Contractors must have a current registration with the System for Award Management (SAM) at http://sam.gov/. The Government bears no legal liability for any costs incurred by responding to this notice. Points of Contact are Melissa Staudacher, Contract Specialist, Email: melissa.staudacher@us.af.mil; or Ryan Mavis, Contracting Officer, Email: ryan.mavis.2@us.af.mil. 5352.201-9101 OMBUDSMAN (JUN 2016) (a) An ombudsman has been appointed to hear and facilitate the resolution of concerns from offerors, potential offerors, and others for this acquisition. When requested, the ombudsman will maintain strict confidentiality as to the source of the concern. The existence of the ombudsman does not affect the authority of the program manager, contracting officer, or source selection official. Further, the ombudsman does not participate in the evaluation of proposals, the source selection process, or the adjudication of protests or formal contract disputes. The ombudsman may refer the interested party to another official who can resolve the concern. (b) Before consulting with an ombudsman, interested parties must first address their concerns, issues, disagreements, and/or recommendations to the contracting officer for resolution. Consulting an ombudsman does not alter or postpone the timelines for any other processes (e.g., agency level bid protests, GAO bid protests, requests for debriefings, employee-employer actions, contests of OMB Circular A-76 competition performance decisions). (c) If resolution cannot be made by the contracting officer, the interested party may contact the ombudsmen, James Anderson 8110 Industrial Drive, Ste 103 USAFA, CO 80840 Telephone number 719-333-3829 FAX 719-333-9018 Email:� james.anderson.72@us.af.mil Concerns, issues, disagreements, and recommendations that cannot be resolved at the Center/MAJCOM/DRU or AFISRA level, may be brought by the interested party for further consideration to the Air Force ombudsman, Associate Deputy Assistant Secretary (ADAS) (Contracting), SAF/AQC, 1060 Air Force Pentagon, Washington DC 20330-1060, phone number (571) 256-2397, facsimile number (571) 256-2431. (d) The ombudsman has no authority to render a decision that binds the agency. (e) Do not contact the ombudsman to request copies of the solicitation, verify offer due date, or clarify technical requirements. Such inquiries shall be directed to the Contracting Officer. (End of clause)
- Web Link
-
SAM.gov Permalink
(https://beta.sam.gov/opp/87b8ae45cf694892a2ef3478d73f1a39/view)
- Place of Performance
- Address: USAF Academy, CO 80840, USA
- Zip Code: 80840
- Country: USA
- Zip Code: 80840
- Record
- SN05699744-F 20200625/200623230139 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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