Loren Data's SAM Daily™

SAMDAILY.US - ISSUE OF APRIL 10, 2021 SAM #7070
SOURCES SOUGHT

66 -- Ion Beam Mill

Notice Date

4/8/2021 6:38:43 AM
 

Notice Type

Sources Sought
 

NAICS

334516 — Analytical Laboratory Instrument Manufacturing
 

Contracting Office

W6QK INSCOM BELVOIR FORT BELVOIR VA 22060-5246 USA
 

ZIP Code

22060-5246
 

Solicitation Number

21P006342
 

Response Due

4/15/2021 12:00:00 AM
 

Archive Date

04/30/2021
 

Point of Contact

Melanie L. Magner, Phone: 4349807783
 

E-Mail Address

melanie.l.magner.ctr@mail.mil
(melanie.l.magner.ctr@mail.mil)
 

Description

The following features are required: Voltage range� 100 eV to 16keV *� This will allow us to work with soft polymers and paints at low voltage, metals at a medium voltage, and up to very hard materials like silicon carbide, diamond, etc. at high voltages.� We can then easily support all areas such as CC&D to Small Arms and Armor areas. This unit has two ion sources. * This allows for the wide voltage range but also also allows for a ""rough"" mill for faster milling times followed by a ""polish"" mill to finished the part This unit should be equipped with a manual LN2 dewar. LN2 will allow us to handle very soft materials by cooling the sample down to -80C.� The manual dewar option seems the most cost effective option for our production rate. Sample Holders: We will need the following: a 30 degree slope cutting sample holder for cross sectional cuts a 90 degree slope cutting sample holder for cross sectional cuts a hollow puck for planar polishing (32mm deep) a hollow puck for planar polishing adjustable (6-15mm deep) � Imaging System We require a 50-400x magnification�lens and video camera for operation
 

Web Link

SAM.gov Permalink
(https://beta.sam.gov/opp/3db374dd952149bb910cdf2b481333ff/view)
 

Place of Performance

Address: Charlottesville, VA 22911, USA

Zip Code: 22911

Country: USA
 

Record

SN05967072-F 20210410/210408230113 (samdaily.us)
 

Source

SAM.gov Link to This Notice
(may not be valid after Archive Date)

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