SAMDaily.us | SRCSGT | 66 | Atomic Force Microscope (AFM) for Nanoscale Thermomechanics

SAMDAILY.US - ISSUE OF FEBRUARY 17, 2024 SAM #8117
SOURCES SOUGHT

66 -- Atomic Force Microscope (AFM) for Nanoscale Thermomechanics

Notice Date: 2/15/2024 6:23:27 AM
Notice Type: Sources Sought
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
ZIP Code: 20899
Solicitation Number: NIST-SS24-CHIPS-0012
Response Due: 2/29/2024 8:00:00 AM
Archive Date: 03/15/2024
Point of Contact: Jenna Bortner, Tracy Retterer
E-Mail Address: jenna.bortner@nist.gov, Tracy.retterer@nist.gov
(jenna.bortner@nist.gov, Tracy.retterer@nist.gov)
Description: Please see attachment.
Web Link: SAM.gov Permalink
(https://sam.gov/opp/4e2cf2f03e3f4eea95b04c22b6412d95/view)
Place of Performance: Address: Gaithersburg, MD 20899, USA; Zip Code: 20899; Country: USA
Record: SN06968381-F 20240217/240215230100 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

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