SAMDaily.us | PRESOL | J | Annual Maintenance of FEI Helios 600i Focused Ion Beam / Scanning Electron Microscope for Benet Laboratories, Watervliet, NY

SAMDAILY.US - ISSUE OF FEBRUARY 28, 2024 SAM #8128
SOLICITATION NOTICE

J -- Annual Maintenance of FEI Helios 600i Focused Ion Beam / Scanning Electron Microscope for Benet Laboratories, Watervliet, NY

Notice Date: 2/26/2024 6:33:01 AM
Notice Type: Solicitation
NAICS: 811310 — Commercial and Industrial Machinery and Equipment (except Automotive and Electronic) Repair and Maintenance
Contracting Office: W6QK ACC WVA WATERVLIET NY 12189-4000 USA
ZIP Code: 12189-4000
Solicitation Number: W911PT24Q0056
Response Due: 3/4/2024 1:00:00 PM
Archive Date: 03/19/2024
Point of Contact: Connie J. Turner, Phone: 5182664631
E-Mail Address: connie.j.turner.civ@army.mil
(connie.j.turner.civ@army.mil)
Description: Solicitation of services to provide: annual maintenance for FEI Helios 600i Focused Ion Beam (FEB) / Scanning Electron Microscope at Benet Laboratories, Watervliet, NY per attached Performance Work Statement for one year. Service Contract Labor Standards do not apply. This is a Sole Source Procurement with FEI Company. All Responsible Proposals will be Considered.
Web Link: SAM.gov Permalink
(https://sam.gov/opp/92cc92ca842249d5bdd7b688c7fede2e/view)
Place of Performance: Address: Watervliet, NY 12189, USA; Zip Code: 12189; Country: USA
Record: SN06976691-F 20240228/240226230050 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

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