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SAMDAILY.US - ISSUE OF SEPTEMBER 19, 2024 SAM #8332
AWARD

99 -- Automated Defect Inspection Tool

Notice Date
9/17/2024 6:48:28 AM
 
Notice Type
Award Notice
 
NAICS
334513 — Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Industrial Process Variables
 
Contracting Office
DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
 
ZIP Code
20899
 
Solicitation Number
1333ND24PNB680544
 
Archive Date
09/30/2024
 
Point of Contact
Brandon Butler, Forest Crumpler
 
E-Mail Address
brandon.butler@nist.gov, forest.crumpler@nist.gov
(brandon.butler@nist.gov, forest.crumpler@nist.gov)
 
Award Number
1333ND24PNB680544
 
Award Date
09/11/2024
 
Awardee
NANOTRONICS IMAGING, INC Cuyahoga Falls OH 44221 USA
 
Award Amount
564500.00
 
Description
The purpose of this award was to supply, install, and train new users on an Automated Defect Inspection Tool that meets the needs of the BMF community. See attached Sole Source Justification (JOFOC-r).�
 
Web Link
SAM.gov Permalink
(https://sam.gov/opp/ab2fbebc95bb450dbc67b12e017aafdf/view)
 
Place of Performance
Address: Boulder, CO, USA
Country: USA
 
Record
SN07213694-F 20240919/240917230110 (samdaily.us)
 
Source
SAM.gov Link to This Notice
(may not be valid after Archive Date)

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