SOLICITATION NOTICE
66 -- Cryo-Electron Microscopy Instruments
- Notice Date
- 12/17/2024 9:57:51 AM
- Notice Type
- Combined Synopsis/Solicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- BERKELEY NATL LAB - DOE CONTRACTOR Berkeley CA 94720 USA
- ZIP Code
- 94720
- Solicitation Number
- BZ-2025-04
- Response Due
- 1/23/2025 3:00:00 PM
- Archive Date
- 02/07/2025
- Point of Contact
- Brian Zatkow, Phone: 510-495-2547
- E-Mail Address
-
bzatkow@lbl.gov
(bzatkow@lbl.gov)
- Description
- Lawrence Berkeley National Laboratory requests a proposal for Focused Ion Beam and Scanning Transmission Electron Microscope instruments usable at cryogenic conditions for the Molecular Foundry. The final number, combination, and configuration of instruments (including options) that will be acquired is dependent on performance specifications and prices proposed, along with available funding. The capabilities required from these instruments are as follows, listed in order of importance: High resolution TEM imaging used for single particle analysis and cryo-tomography for biological specimens under cryogenic conditions. High resolution STEM imaging for ptychography and 4D-STEM under cryogenic conditions for materials science applications. Dual beam FIB to be used for TEM sample preparation and cryogenic transfer to a TEM. It is possible that combinations of these capabilities could be satisfied with fewer than three instruments. Offerors may propose any number of instruments that would satisfy these requirements. Please see the RFP document for full details.
- Web Link
-
SAM.gov Permalink
(https://sam.gov/opp/04c7fe9b282a40d891fd75d597a8aaca/view)
- Place of Performance
- Address: Berkeley, CA 94720, USA
- Zip Code: 94720
- Country: USA
- Zip Code: 94720
- Record
- SN07295025-F 20241219/241217230123 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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