SOLICITATION NOTICE
66 -- X-Ray diffractometer
- Notice Date
- 1/30/2025 3:20:28 PM
- Notice Type
- Solicitation
- NAICS
- 334517
— Irradiation Apparatus Manufacturing
- Contracting Office
- BERKELEY NATL LAB - DOE CONTRACTOR Berkeley CA 94720 USA
- ZIP Code
- 94720
- Solicitation Number
- LBLAM20250117
- Response Due
- 2/7/2025 1:00:00 PM
- Archive Date
- 02/08/2025
- Point of Contact
- Anita Mathias
- E-Mail Address
-
amathias@lbl.gov
(amathias@lbl.gov)
- Small Business Set-Aside
- SBA Total Small Business Set-Aside (FAR 19.5)
- Description
- 1 - X-RAY diffractometer. The system must meet the following minimum technical requirements and capabilities. 1) High brightness Cu x-ray source and solid-state 2D area detector. 5kW or brighter, sealed or rotating anode. 2) Automated or user interchangeable optics to enable the following X-ray measurement types: � Reflected beam optics: Bragg-Brentano, Parallel beam, Convergent spot-focused beam <500um. � Transmission beam optics: focusing optics for high resolution measurements. 3) Integrated sample mounting and software integration to enable the following: � High-throughput sample stage for min. 96 well-plate. Software/hardware automation for alignment/measurement. � Horizontal sample mount for both high-throughput stage and single sample that has the ability to measure in both reflection and transmission mode. � Heating stage with integrated temperature control and measurement from room temperature to 1000C or greater. Must be compatible with vacuum, ambient, inert and reactive gasses, to include hydrogen gas. � Detection and guidance features to ensure proper optical path accessories are installed for the type of measurement being performed. � Must have automated beam alignment. 4) Software requirements: � Software must have a user-friendly interface, and the ability to save measurement presets and set user/administrator settings as this tool will be available as a non-specialist, multi-user capability. � Software must enable external scripting (such as Python) for automating hardware sample positioning and measurement controls. � Must include a comprehensive suite of data analysis capabilities, including: Rietveld refinement, texture analysis, whole pattern fitting, peak-fitting, thin-film reflectivity pattern analysis, and data visualization.
- Web Link
-
SAM.gov Permalink
(https://sam.gov/opp/3b44027d70a34cf2a55200e59143436a/view)
- Place of Performance
- Address: Berkeley, CA 94720, USA
- Zip Code: 94720
- Country: USA
- Zip Code: 94720
- Record
- SN07328435-F 20250201/250130230113 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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