SPECIAL NOTICE
99 -- Scan Wave 2 Probe Interface module for the Asylum AFM system.
- Notice Date
- 7/30/2025 1:01:14 PM
- Notice Type
- Special Notice
- Contracting Office
- DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
- ZIP Code
- 20899
- Solicitation Number
- NB643090-25-02337
- Response Due
- 8/13/2025 10:00:00 AM
- Archive Date
- 08/28/2025
- Point of Contact
- Erik Frycklund
- E-Mail Address
-
erik.frycklund@nist.gov
(erik.frycklund@nist.gov)
- Description
- FBO ANNOUNCEMENT: PRESOLICITATION NOTICE, NOTICE OF INTENT ACTION CODE: SPECIAL NOTICE SUBJECT: Sole source � Scan Wave 2 Probe Interface module for the Asylum AFM system. SOLICITATION NUMBER: NB643090-25-02337 RESPONSE DATE: 8/13/25 DESCRIPTION: The National Institute of Standards and Technology, Materials Measurement Science Division is engaged in a combination of fundamental research, standards production, and applied science and engineering. This work aims to foster innovation in U.S. industry and meet the measurement science needs of our various agency partners. Among its many projects, this group focuses on developing nanoscale electrical and mechanical measurement methodologies for characterizing material properties. These methodologies are essential for understanding and advancing the fabrication of semiconductor devices. Many of these characterizations are performed on Atomic Force Microscopes (AFM) like an existing Vero AFM (Oxford Instruments Asylum Research). We have an extensive suite of capabilities on this Vero AFM, including nanoscale electric (current, surface potential, capacitance) and mechanical (various elastic and plastic) capabilities. In some projects, we need to add nanoscale impedance characterization to complement our existing characterizations and have a more compelling understanding of the material properties that we measure. This nanoscale impedance will provide measurements of permittivity and conductivity at the nanoscale, also enabling the identification of dopant polarity (n-type or p-type) and quantification of the carrier dopant levels from intrinsic silicon to 1E20 cm^-3, regardless of the type and species of the dopant. The impedance characterization can be combined with other nano-electric and mechanical AFM measurements, offering innovative ways to investigate domains and interfaces with varying conductivity and buried structures, such as SRAM flash memory. The National Institute of Standards and Technology (NIST) intends to negotiate on a sole source basis, under the authority of FAR 13.106-1(b) (1), with PrimeNano located in Santa Clara, CA for the purchase of this equipment. Sole Source justification is based on the following: Market research has shown that the only source for this specific replacement Probe Interface module is though the manufacturer, PrimeNano. NIST currently owns a PrimeNano probe interface which requires a upgrade that is currently mounted to a scanning Microwave Impedance Microscopy (sMIM) module on an old MFP-3D Asylum AFM. However, this AFM lacks some of the advanced electromechanical capabilities of the new Vero AFM. Choosing the Vero AFM is preferable because it allows us to integrate sMIM measurements with the multimodal AFM characterizations available on this new AFM. Additionally, the scanning capabilities of the Vero AFM are superior to those of the MFP-3D. To implement the sMIM on the Vero AFM, we can utilize the existing ScanWave electronics from the sMIM module and add a probe-sample interface specifically designed by PrimeNano for the Vero AFM. We will coordinate this request with another one to acquire a customized sMIM Cypher S kit (holder and accessories) for the Vero AFM holder to ensure full compatibility of the new components with our existing equipment. The ScanWave 2.0� Probe Interface module for the Asylum AFM, produced by PrimeNano Inc., is the only solution that meets all specified requirements. It includes an interface probe sample module designed to provide direct measurements of the local impedance of the sample. Furthermore, it is compatible with the existing Vero AFM hardware, which consists of the sample stage and probe holder. PrimeNano Inc. will ensure proper connectivity by facilitating the direct interface between the ScanWave electronics module and the Vero AFM holder. As PrimeNano Inc. is the sole manufacturer and distributor of the ScanWave 2.0� Probe Interface module for the Asylum AFM, and no other vendor can meet the Agency's needs. When contacted, the manufacturer stated in writing they were the sole manufacturer and distributor of this product. NAICS code for this requirement will be 334516� Analytical Laboratory Instrument Manufacturing with a small business size of 1000 employees. No solicitation package will be issued. This notice of intent is not a request for competitive quotations; however, interested parties who regard themselves as capable of fulfilling these requirements are invited to submit responses to the Government for consideration. Responses received by 1:00PM EST on 8/13/25 will be considered by the Government. A determination by the Government not to compete the proposed acquisition based upon responses to this notice is solely within the discretion of the Government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement. Inquiry POCs Erik.Fycklund@nist.gov Primary Donald.Graham@nist.gov Secondary National Institutes of Standards and Technologies NIST Acquisition Management Division (AMD) 100 Bureau Dr. Mail Stop 1640 Gaithersburg, MD. 20899-1640
- Web Link
-
SAM.gov Permalink
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- Record
- SN07529748-F 20250801/250730230054 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
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