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SAMDAILY.US - ISSUE OF SEPTEMBER 04, 2025 SAM #8683
SPECIAL NOTICE

66 -- 66--In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL

Notice Date
9/2/2025 6:22:19 AM
 
Notice Type
Special Notice
 
NAICS
334516 — Analytical Laboratory Instrument Manufacturing
 
Contracting Office
OFC OF ACQUISITION GRANTS-DENVER DENVER CO 80225 USA
 
ZIP Code
80225
 
Solicitation Number
140G0225Q0088
 
Response Due
9/8/2025 1:30:00 PM
 
Archive Date
09/09/2025
 
Point of Contact
Williams, Lisa, Phone: 303-236-9327, Fax: 303-236-5859
 
E-Mail Address
ldwilliams@usgs.gov
(ldwilliams@usgs.gov)
 
Description
In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL USA Special Notice of Intent to Award a Sole Source Procurement. THIS IS NOT A REQUEST FOR QUOTE. THIS IS A NOTICE OF THE GOVERNMENT'S INTENT TO ISSUE A SOLE SOURCE AWARD. This Notice is to announce that the U.S. Department of the Interior (DOI), U.S. Geological Survey (USGS), Geology, Geophysics, and Geochemistry Science Center is proposing to negotiate a contract with JEOL USA, Inc. on a sole source basis for the purchase of a demo unit JEOL JSM-IT800(HL) in-lens field emission gun scanning electron microscope (FESEM). The proposed action is for products/services for which the Government intends to solicit and negotiate with only one source under the authority FAR 13.106-1(b)(1). The reason justifying this sole source procurement is that the Government believes only one responsible source can provide the products/services that will satisfy the agency's requirement. The following is a description of the product that are required but not limited to: 1. Resolution: 0.7nm @20kV, 1.3 nm @ 1kV, 3.0 nm at 15 kV 2. Magnification: Photo magnification: �10 to �2,000,000 (128 � 96 mm) Display magnification: �27 to �5,480,000 (1,280 � 960 pixels) 3. Landing voltage: 0.01 to 30 kV 4. Probe current and detector: 5 pA to 300 nA (30 kV) 5 pA to 100 nA (5 kV) In column probe current detector present Absorbed current meter 5. Imaging Detectors: Secondary electron detector (SED) Upper electron detector (UED) Low vacuum secondary electron detector Retractable backscattered electron detector Chamber camera 6. Other Detectors: 60 mm SDD EDS Detector System must be compatible with JEOL SXES detector 7. Electron gun: In-lens Schottky Plus field emission electron gun 8. Emitter warranty period 3 years 9. Aperture angle control lens (ACL): Built-in 10. Objective lens: Hybrid Lens 11. Specimen stage control: Full eucentric goniometer stage, 5-axis motor drive Stage movement range - X:70mm Y:50mm Z:1 to 41mm Tilt: -5 to 70 degrees, rotation: 360 degrees 12. Specimen size: 170 mm diameter by 45 mm high 13. Cooling and Vacuum: Air cooled water chiller, Retractable low vacuum system This is a sole source notice published for informational purposes only and not a request for competitive quotes. Therefore, no solicitation document exists for this requirement. However, all responsible parties interested in responding to this notice are invited to submit a capability statement by the time and date specified in this notice that provides sufficient details for consideration by the Government, via email to: ldwilliams@usgs.gov. The determination not to compete the contract based on the responses to this notice is solely within the discretion of the Government. Phone calls will not be accepted in response to this notice. All information submitted should support the offeror's capability to provide the product required and shall be furnished at no cost or obligation to the Government. Responses must be in writing and must provide clear and concise documentation indicating an offeror's bona fide capability to provide these services. Verbal responses are not acceptable and will not be considered. The Government reserves the right to cancel this requirement. Special Notice of Intent to Award a Sole Source Procurement. THIS IS NOT A REQUEST FOR QUOTE. THIS IS A NOTICE OF THE GOVERNMENT'S INTENT TO ISSUE A SOLE SOURCE AWARD. This Notice is to announce that the U.S. Department of the Interior (DOI), U.S. Geological Survey (USGS), Geology, Geophysics, and Geochemistry Science Center is proposing to negotiate a contract with JEOL USA, Inc. on a sole source basis for the purchase of a demo unit JEOL JSM-IT800(HL) in-lens field emission gun scanning electron microscope (FESEM). The proposed action is for products/services for which the Government intends to solicit and negotiate with only one source under the authority FAR 13.106-1(b)(1). The reason justifying this sole source procurement is that the Government believes only one responsible source can provide the products/services that will satisfy the agency's requirement. The following is a description of the product that are required but not limited to:
 
Web Link
SAM.gov Permalink
(https://sam.gov/opp/62fc759467cd4fa6a3a781211b1c8f96/view)
 
Record
SN07574213-F 20250904/250902230045 (samdaily.us)
 
Source
SAM.gov Link to This Notice
(may not be valid after Archive Date)

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