DEVELOPMENTS AT NIST POC: Marcia Salkeld (301) 975-4188. Researchers at the National Institute of Standards and Technology (NIST) have developed a number of new devices and methods involving a variety of technologies. In certain cases other parties have participated in the development of these technologies. Anyone interested in the further development of any of these technologies or in applying for a license to commercialize these technologies should send a written request for further information, referencing the NIST Docket Number and Title, to: Marcia Salkeld, National Institute of Standards and Technology, Industrial Partnerships Program, Building 820, Room 213, Gaithersburg, Maryland 20899; Telecopy: 301-869-2751. This is not an announcement of a contract action or a grant. NIST Docket Number: 94-020; Title: Miniature X-Ray Source; Description: This invention is a method to generate x-rays by the use of microscopic cathodes. It can be used to make miniature x-ray sources a few millimeters in dimension, or to make large area flat-panel x-ray sources. The invention is applicable to diverse fields such as radiotherapy and x-ray microscopes. NIST Docket Number: 94-024; Title: Construction of Large Structures By Robotic Crane Placement of Modular Bridge Sections; Description: This system for efficient, safe, cost-effective construction of highway bridges, traffic overpasses and bypasses, and causeways over water or wetlands provides continuous site assembly of repetitive modular elements. The payload (one or more modular bridge sections), attached to the crane's cables, becomes a component of a stable lifting and positioning system. Installed modular elements become a staging platform for constructing subsequent modular elements. NIST Docket Number: 94-040CIP; Title: Method and Reference Standards for Measuring Overlay in Multilayer Structures, and for Calibrating Imaging Equipment as Used in Semiconductor Manufacturing; Description: Optical instruments used to inspect semiconductor wafers during fabrication are calibrated according to a test structure having provisions for overlay-measurement extraction from the same feature set by both electrical and optical means. Electrical measurements are performed once to certify the as-fabricated overlay of the structure. Measurements may be performed on the structure on subsequent occasions by optical instruments to enable the determination of the shift errors prevailing in a particular instrument/fabrication-process scenario. NIST Docket Number: 95-008; Title: Automated Deformable Vacuum Chuck and Interferometer for Wafer Polishing and Metrology; Description: Varied combinations of an automated optical-figure-measuring interferometer with appropriate software and a deformable chuck applying edge moments are used to remove low spacial frequency surface deformations on silicon wafers to maximize polishing productivity and uniformity. In addition, local thickness variations can be measured with precision. Technology available for commercial use without a license. NIST Docket Number: 95-028; Title: Liquid to Liquid Heat Pump with Zeotropic Refrigerant Mixtures; Description: This liquid-to-liquid heat pump system minimizes environmental impact while maintaining its heating/cooling function by using less refrigerant over a longer period of time, changing to environmentally safe refrigerants, and preserving efficiency with zeotropic refrigerant mixtures. Technology available for commercial use without a license. NIST Docket Number: 95-042CIP; Title: Multilayer Film Injection Thermal Converters; Description: The Multilayer Film Multijunction Thermal Converters (MLF-MJTC) of this NIST invention provide primary and secondary calibration standards and the precise measurement of ac and RF voltage and current over a broad frequency range. The form is suitable for low-cost mass production for inclusion in a variety of instruments.

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