NASA/Langley Research Center, Mail Stop 144, Industry Assistance Office, Hampton, VA 23681-0001

66 -- SCANNING PROBE MICROSCOPE SOL 1-168-RCA.1108 DUE 072800 POC Kimberly D. Duncan, Contract Specialist, Phone (757) 864-3566, Fax (757) 864-6966, Email k.d.duncan@larc.nasa.gov -- Susan E. McClain, Contracting Officer, Phone (757) 864-8863, Fax (757) 864-9775, Email s.e.mcclain@larc.nasa.gov WEB: Click here for the latest information about this notice, http://nais.msfc.nasa.gov/cgi-bin/EPS/bizops.cgi?gr=D&pin=23#1-168-RCA.1108. E-MAIL: Kimberly D. Duncan, k.d.duncan@larc.nasa.gov. This notice is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; quotes are being requested and a written solicitation will not be issued. This procurement is being conducted under the Simplified Acquisition Procedures (SAP) in accordance with FAR Part 13.5 Test Program. 1 EACH -- Scanning Probe Microscope (Atomic Force Microscope (AFM)) with options for topographic, magnetic, electrical, force, electrochemical and mechanical property measurement capabilities with the following specifications: SPECIFICATIONS FOR ATOMIC FORCE MICROSCOPE (AFM): 1. The AFM shall be capable of topographical imaging via contact mode, intermittent contact mode or non-contact mode in air; 2. The AFM shall be capable of topographical imaging via contact or intermittent contact mode in fluids; 3. The AFM shall be capable of providing image contrasts as a result of variations in sample composition, friction, hardness, adhesive properties and viscoelastic properties; 4. The AFM shall be capable of measuring the magnetic force gradient distribution above the sample surface without artifacts due to height differences resulting from the sample topography; 5. The AFM shall be capable of measuring the electric field gradient distribution above the sample surface without artifacts due to height differences caused by sample topography; 6. The AFM shall be capable of measuring elasticity/stiffness of the sample surface features and providing quantitative values after calibration; 7. The AFM shall be capable of measuring frictional forces between chemical groups attached to the probe tips and the sample surface; 8. The AFM shall be capable of measuring surface hardness via nanoindenting, and film adhesion and durability via scratching; 9. The AFM shall be capable of measuring attractive, repulsive and adhesive forces between the tip and the sample during approach, contact and separation; 10. The AFM shall be capable of displaying images of force variation and topography, as well as individual force curves at any point of the sample; 11. The AFM shall be capable of providing morphological imaging of surfaces in electrolyte solutions with or without potential control; 12. The AFM shall be capable of obtaining topographical images using tunnelling current on conductive samples with currents covering the range of at least 50 pA -- 100 nA; 13. The AFM shall include an optical viewing system to provide a vertical optical view of the tip and sample surface. The optical microscope shall be capable of magnification up to at least 450X. The images shall be accessible on an external color monitor; 14. The AFM shall have the capability of obtaining images of samples heated up to at least 2000C; 15. The AFM shall have provision for an environmental chamber with ports that allow changes in the atmosphere that a sample can be subjected to. The environmental chamber shall not prevent access to the viewing of the sample on the external monitor; 16. The AFM design shall allow for minimal coupling between the lateral and vertical motion of the cantilever. Image noise due to vertical non-linearity is not acceptable. The AFM scanner shall be capable of linear output for the scan sizes ranging from 5 nm -- 905m; 17. The Digital to Analog converter of the AFM system shall have capability for proportionally scaling down of any noise as the scan size is decreased; 18. The Contractor may be asked to demonstrate all the capabilities specified above before acceptance of a bid at the Contractor's expense; 19. The contractor shall provide technical support on operation, applications and troubleshooting of the instrument when necessary. The provisions and clauses in the RFQ are those in effect through FAC 97-18. The SIC code and the small business size standard for this procurement are 3826 and 500 employees, respectively. The quoter shall state in their quotation their size status for this procurement. All qualified responsible business sources may submit a quotation which shall be considered by the agency. Delivery to NASA Langley Research Center is required within approximately 30 days ARO. Delivery shall be FOB Destination. The DPAS rating for this procurement is DO-C9. Quotations for the items(s) described above are due by 4:30 p.m. local time, July 28, 2000 and may be mailed or faxed to NASA Langley Research Center, Attn: Kim Duncan, Mail Stop 126, Hampton, VA 23681-2199 or faxed to 757-864-6966 and include, solicitation number, FOB destination to this Center, proposed delivery schedule, discount/payment terms, warranty duration (if applicable), taxpayer identification number (TIN), identification of any special commercial terms, and be signed by an authorized company representative. Quoters are encouraged to use the Standard Form 1449, Solicitation/Contract/Order for Commercial Items form found at URL: http://procure.arc.nasa.gov/Acq/Forms/Index.html to submit a quotation. Quoters shallprovide the information required by FAR 52.212-1. If the end product(s) quoted is other than domestic end product(s) as defined in the clause entitled "Buy American Act -- Supplies," the quoter shall so state and shall list the country of origin. The Representations and Certifications required by FAR 52.2l2-3 may be obtained via the internet at URL: http://ec.msfc.nasa.gov/msfc/pub/reps_certs/sats/ FAR 52.212-4 is applicable. Addenda to FAR 52.212-4 are as follows: 52.211-17, 1852.215-84. FAR 52.212-5 is applicable and the following identified clauses are incorporated by reference. 52.222-3, 52.225-13, 52.233-3, 52.203-6, 52.219-8, 52.219-9, 52.222-21, 52.222-26, 52.222-35, 52.222-37, 52.225-3, 52.232-34 The FAR may be obtained via the Internet at URL: http://www.arnet.gov/far/ The NFS may be obtained via the Internet at URL: http://www.hq.nasa.gov/office/procurement/regs/nfstoc.htm Questions regarding this acquisition must be submitted in writing no later than July 20, 2000. Award will be based upon overall best value to the Government, with consideration given to the factors of proposed technical merits, price and past performance; other critical requirements (i.e., delivery) if so stated in the RFQ will also be considered. Unless otherwise stated in the solicitation, for selection purposes, technical, price and past performance are essentially equal in importance. It is critical that offerors provide adequate detail to allow evaluation of their offer (see FAR 52.212-1(b). Quoters must provide copies of the provision at 52.212-3, Offeror Representation and Certifications -- Commercial Items with their quote. See above for where to obtain copies of the form via the Internet. An ombudsman has been appointed -- See NASA Specific Note "B". It is the quoter's responsibility to monitor the following Internet site for the release of amendments (if any): http://nais.msfc.nasa.gov/cgi-bin/EPS/bizops.cgi?gr=C&pin=23 Potential quoters will be responsible for downloading their own copy of this combination synopsis/solicitation and amendments (if any). Any referenced notes can be viewed at the following URL: http://genesis.gsfc.nasa.gov/nasanote.html Posted 07/13/00 (D-SN474584). (0195)

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