66 -- SCANNING ELECTRON MICROSCOPE

Notice Date

January 26, 2001

Contracting Office

NASA/John F. Kennedy Space Center, Procurement, Kennedy Space Center, FL 32899

ZIP Code

32899

Solicitation Number

PR0306-6441

Response Due

February 7, 2001

Point of Contact

Ida M. Ramirez, Contract Specialist, Phone (321) 867-9125, Fax (321) 867-2825, Email Ida.Ramirez-1@ksc.nasa.gov -- David D. Reeves, Contracting Officer, Phone (321) 867-3999, Fax (321) 867-1029, Email David.Reeves-1@ksc.nasa.gov

E-Mail Address

Ida M. Ramirez (Ida.Ramirez-1@ksc.nasa.gov)

Description

The Government intends to acquire a commercial item using FAR Part 12 and the Simplified Acquisition Procedures set forth in FAR Part 13. This notice is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation, which is issued as a Request for Quotation (RFQ); quotes are being requested and a written solicitation will not be issued. Offerors are required to use the On-Line RFQ system to submit their quote. The On-line RFQ system is linked above or it may be accessed at http://procurement.nasa.gov/cgi-bin/EPS/bizops.cgi?gr=C&pin= . The information required by FAR Subpart 12.6 is included in the on-line RFQ. NASA/KSC plans to acquire one (1) each Scanning Electron Microsope. The Scanning Electron Microscope required by the Government shall meet minimum specifications as described herein. The specifications are derived from the LEO Model 1455 (Cambridge) Scanning Electron Microscope and are considered minimum requirements. Some flexibility from the precise detail mentioned in the specifications may be allowed; however, the detailed specifications set-off by quotation marks (" ") are ABSOLUTELY ESSENTIAL minimum specifications required to meet the Government's needs and no deviation or flexibility will be allowed. "Spatial Resolution with Tungsten Filament = 3.5 nanometers minimum. Acceleration voltage Range 200V to 30 kV." Probe Current Range 1 picoAmp to 1 microAmp Magnification Range "5X to 900,000X," continuously variable in coarse or fine modes, Pre-set capability and auto compensation, corrected for changes in working distance or acceleration voltage. Electron optics includes, automatically adjusted EHT Bias, Electron gun alignment, Automatic Gun Run-up, and on screen Information to include help instructions for filament replacement. Lens Control: "Optibeam" electronic coupling, enhanced depth-of field control. Probe current adjustment, Hysteresis correction. "Automatic and Manual Focus control," Conical 35 degree objective, working distance variable from "1mm to 125mm minimum range." Automatic Focus compensation over entire range of voltage and current, Dynamic focus correction for specimen tilt from plus or minus 80 degrees. Rotation compensation. Automatic Stigmator control from either mouse or using 2-D Navigation Box. Three Apertures with micrometer controls for precise alignment. Focus Wobble for aperture alignment, Beam Shift control for image position at high magnifications. Range +/-205m. "Extra Large Specimen Chamber: At least 300 mm long by 340 mm wide by 279 mm deep." Seven accessory ports on the large chamber and specimen door. Specimen Stage: Standard "high precision 5-axis motorized stage. Drawer type, with X movement of 100 mm (1 50 mm), Y direction of 125mm (+75mm -50mm). Z movement of 123 mm., Rotation 360 degree continuous, Tilt 0 to 90 degrees." Maximum specimen weight up to 0.5 Kg. Compucentric Control, Touch Alarm, and specimen mounts (Single and eight position holders for 13 mm diameter stubs. Single holder for 32 mm diameter stubs with quick fit mounts. "Secondary Electron Detector:" Phosphor scintillator with optically coupled photomultiplier, Collector Bias: Adjustable from -250V to +400 V continuously. "Automatic Contrast and Brightness controls with manual override." Four Signal Inputs with mixed mode for enhanced image, selectable and auto and manual control compatible with video-type input detector signals. Also selective inversion control. Raster Scanning with fifteen non-interlaced electron beam scan speeds that range from 0.09 sec/frame to 42 min/frame. "Scan Modes include: Small Raster (adjustable), Spot mode, beam position indicated by a cursor superimposed on a frozen image of the specimen, Line Scan (adjustable position), Line Profile to show variation of signal to provide precise adjustment of contrast and brightness, Scan Rotation (360 degrees at all scan rates) and Tilt Correction." Image Processor will include Image Store with "Resolution 3072 x 2304 pixels minimum," each 8 bits. (Images will be stored on hard drive described under "Image input/output" specifications). Display of images will be on a non-interlaced display of the stored contents at 1024 x 768 minimum resolution, with annotation and Windows overlays. Image processing will also include Multiple Pixel Averaging and Continuous Averaging up to 256 scans to display the specimen image." Frame Integration up to 256 frames integrated with freeze option at designated end of scan numbers. "Image Display will be provided on dual high contrast color SVGA 17-Inch Monitors (1024 x 768 pixels) with both image and Windows menus which allows full control of two simultaneously displayed images which include enhanced image manipulation, and also allow a drag and drop mode between the two Monitors." Display Modes will include "Split Screen side by side live display of the same image using input from any combination of installed detectors." Image halves may be selectively processed and frozen. Also included are Histogram displays which show gray level adjustment display, Profile mode to show gray level intensity along a selected line (adjustable line orientation), and Pseudo-Color using a color table editing facility from a palette of up to 16 million colors. Individual or user-defined bands of gray levels may be colored with the aid of image-to-LUT correlation and flexible gray band selection. "Image Overlays will provide a selectable display of acceleration voltage, working distance and a scale bar with calibration standard verification." Also a custom data zone may be assembled using any of the system parameters (aperture, detector, text and background colors selectable solid or transparent). A status menu will be available to allow display of any operating parameter stored in the status display choice lists, such as brightness, contrast and all other variable parameters). Image Annotation will allow text to be entered to any position of the image. Windows fonts and sizes will be included along with micron markers, fixed and variable. Text color, style and background are freely selectable. Overlay text may be stored either separately or merged with the image as required. Measurement functions include horizontal and vertical measurements, Point to point distance measurement, with two pairs of point to point cursors displayed simultaneously. Angular measurement showing angles between features will be included as well as Radial circular measurement to provide diameter measurement or particle size estimation. "Image Input and Output will consist of a Dye Sublimation Printer or better for high quality hard copy. Any images viewed and associated overlays may be recorded with photographic quality. Image output will also be provided for Network compatible output using a State of the Art network card. All images are stored in industry standard TIFF format, bitmap (BMP) and JPG." "The Minimum requirements for the Integrated computer Environment would include a Central Processor Pentium III, 600 Megahertz, with 128 Megabytes RAM, Windows 98 and associated Serial, Parallel, SCSI and USB ports," a 10 base2 and 10 base T network card, Hard Drive minimum 13 Gigabytes, Floppy disk drive, "CD-ROM 40 speed EIDE standard with write capability, Windows keyboard and three button serial mouse." "The Vacuum System will be fully automatic with a two stage 10 cubic meter/hr Rotary Pump, and activated alumina foreline trap and a Turbomoleular Pump." A Penning gage for high vacuum measurement, and other necessary vacuum gages, valves and equipment. A closed loop cooling water circular (chiller) of 1.5 liters/min. Power will be standard 208-240 V, 50/60 Hz Single Phase. The chemical analytical component of this SEM is the Oxford ISIS Energy Dispersive Spectroscopy (EDS) Accessory. (This was originally the high quality Lynk system which was specifically designed to interface with the Cambridge microscope). The two instruments are designed to work together for optimum analytical outputs and specially designed (expensive) large machined fittings are in place with the original equipment which will directly interface with the new instrument. "The new SEM instrument must be interfaced with the Oxford ISIS EDS at no additional cost." Note: A trade-in value credit for the currently existing Cambridge (Model S-200) Scanning Electron Microscope will be taken into consideration during evaluation of offers. Questions regarding this acquisition must be submitted in writing (e-mail is preferred) no later than January 30, 2001. It is the quoter's responsibility to monitor this site for the release of amendments (if any). Potential quoters will be responsible for downloading their own copy of this notice, the on-line RFQ and amendments (if any). An ombudsman has been appointed -- See NASA Specific Note "B".

Web Link

Click here for the latest information about this notice (http://nais.msfc.nasa.gov/cgi-bin/EPS/bizops.cgi?gr=D&pin=76#PR0306-6441)

Record

Loren Data Corp. 20010129/66SOL012.HTM (D-025 SN50B8M8)